Base Technological Solutions of «Basis.5» IMA Platform

Base Technological Solutions of «Basis.5» IMA Platform

Base Technological Solutions of
«Basis.5» IMA Platform
Dmitriy Kulikov, Konstantin Tarandevich
Base Requirements to “Basis.5” IMA Platform
Resources sharing by several applications
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Incremental certification
Part number reduction
Common toolset for different applications
Module nomenclature minimization
Increased number of supported functions
Scalability
OPEN technologies and high-speed
switched fabric architectures
High performance heterogeneous architectures
Portable software
Resources reconfigurability
COTS technologies
Tools and development processes
integration
General system solutions
standardization
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“Basis.5” IMA Platform Evolution
IMA 1G Platform Architecture
CPM
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1
C
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0
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CPM
CPM
CPM
C
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C
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0
C
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C
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1
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n
C
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0
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C
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n
VPX
VPX 6U
6U
(VITA46,VITA48)
Software Portability
Implementation
CPM
CPM
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0
C
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1
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n
C
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0
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CPM
CPM
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C
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1
C
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C
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OPEN Embedded Computer Technologies and Standards Support,
Platform High-Speed Switched Fabric Architecture and
MultiCore Processor Module Architecture
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“Basis.5” IMA Platform Evolution
C
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CPM
CPM
CPM
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0
C
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n
C
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0
C
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1
C
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C
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0
C
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1
CPM
C
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n
C
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0
C
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1
C
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IMA 2G Platform Architecture
Multilevel Reconfiguration
of Computational Resources
CPM
C
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0
C
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1
C
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0
C
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1
CPM
CPM
CPM
C
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n
C
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n
C
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0
C
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C
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C
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1
Creation of Integrated Environment
for Software Development
C
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n
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“Basis.5” IMA Platform Prototype
VPX 3U
IMA 2G Platform (Resource Center Configuration)
(VITA46,VITA48)
CPM
PMC/XMC
(VITA20,VITA42)
Central
Processing
Module
GPMm
Graphic
Processor
Mezzanine Module
M3m
NSM
ARINC-664
Network
Module
Mass Memory
Mezzanine Module
AIMm
Avionics Interface
Mezzanine Module
МСM
IMA 2G Platform (IRDC Configuration)
PMC/XMCMezzanine
Carrier Module
PSM
Power
Supply Module
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Base System Solutions of “Basis.5” IMA Platform
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Base Requirements to ARINC664p7 (AFDX) End System
Jitter
Redundancy Concept
Integrity Checking
Redundancy
Management
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Variants of ARINC664p7 (AFDX) End System Implementation
HW
 Implementation on lowperformance systems
 Lack of flexibility at adaptation
according to new requirements
 HW life cycle reduction
 Full recertification at
substitution of HW
implementation (element base)
 Development costs increase
vs
SW
 Higher requirements to system
performance
 Problems of multicore solutions
certification
 High level of adaptation to new
requirements
 Scalability
 Low cost error correction
 Portability at HW substitution
 Incremental certification at
modernization
 Possibility of COTS solutions
usage at implementation
 Development costs and time
reduction
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ARINC664p7 (AFDX) End System Implementation in “Basis.5”
IMA Platform
HW/SW Structure of ARINC 664 (AFDX) End-System
(AFDX ES) in CPM
Implementation Features
Jitter
Timer core1
Integrity checking
SW implementation according to
ARINC664p7 requirements
Redundancy
management
SW implementation according to
ARINC664p7 requirements
Intercommunication
with ARINC653
OSRT
Shared memory (RAM) or L2/L3
ARINC615A support
Via intercommunication with
CPM initial loader
Configuration data
original format
XML
Functional testing
AIM company SW/HW test
equipment
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Functional Testing of ARINC664p7 (AFDX) End Device
Researched Issues:
 The possibility of ARINC664p7 (AFDX) end system SW implementation
according to the requirements of the standard
 ARINC664p7 (AFDX) end system SW implementation functioning on
multicore CPU in combination with ARINC653 compatible RTOS
 The possibility of COTS solutions usage for application-specific
interface creation
 The possibility of testing using HW/SW equipment and the methods of
AFDX leading manufacturer
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Implementation of ARINC664p7 (AFDX) End System
Functional Testing
1/2
2/2
End System Functional Test Bench Structure
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Results of Functional Testing of ARINC664p7 (AFDX) End Device SW
Implementation
Achieved Results:
 Creation of the effective ARINC664p7
(AFDX) end device SW
implementation (0 < Jitter < 4 µs)
 The system is easily adaptive to new
requirements and scalable
 Creation of portable SW components
 Adoption of test equipment of one of
the leading AFDX devices
manufacturer
 Correction of SW only during testing
 Usage of COTS solutions at the
implementation
Test Report with
the detailed Test
Protocol
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