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Southwest Test Workshop Attendee List
Southwest Test Workshop Attendee List Yuichi Abe Joyce Adams Joe Ahladis Chris Albert Joanne Allison Eric Amundsen James Andersen Jim Anderson Seijo Arai Lance Arakaki Tony Auwn Kamal Azizi Joseph Baker Ashwim Ballal Timothy Barr Denny Bates Ruth Bauer Rick Baze Steve Beaver Clive Beddoe-Stephens Bill Bedore Lee Bemis Andrei Berar Todd Bernatsky Scott Bernin Richaro Bialobrodski Greg Bieser Gregory Bishop Mike Bivens Tokyo Electron Ltd MJC Micronics, Inc. Applied Precision, Inc. Teradyne, Inc. Probe Technology Mayo Foundation Applied Precision CerProbe Corporation TSK America Rockwell Semiconductor Systems Teradyne LSI Logic ICT Electroglas CerProbe Corporation Cerprobe Contact Technologies Synergetix Micro-Probe, Inc. ICT I.D.I. ESH Credence Systems Corp. Xandex Inc. Rockwell Semiconductor Systems Tokyo Electron Ltd. Probe Specialists Inter-Logic Sys. Co. Probe Technology 408-566-4427 650-968-3531 425-557-1000 617-422-2143 408-980-1740 507-266-4301 425-557-1000 602-333-1725 972-735-0880 619-535-3586 617-422-3271 408 433-8089 203-264-5757 408-727-6500 408-570-3402 602-497-4264 408-498-6787 972-874-1003 760-603-0631 x31 203-426-9880 913 342-5544 602-438-1112 510-623-5189 707-763-7799 x125 619-535-3382 408-566-4412 408-982-9123 714-891-4456 408-980-1740 Page 1 of 15 [email protected] [email protected] albert!icd.teradyne.com [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List Kenneth Blakkan Roland Blass Eric Bogatin Greg Boll Harry Boll Michael Bonham Jill Borchers Jim Bordenave Jerry Bortnem Timothy Boyle Tim Bozych Mark Bradford Mark Brandemuehl Michael Brannan Don Brown Jerry Broz Elvis Bruner Christine Bui Ken Burdette E. S. (Bud) Cain Allan Calamoneri Jean-Louis Carbonero Kevin Carlile Dai Dee Casavant Derek Castellano Shu Min Chen Jimmy Chen Ming-Yi Chen Kwang-Ting Tim Cheng Micro Module Systems Inc MJC Micronics-APS Gmbh Signal Integrity Products GGB Industries GGB Industries CerProbe Corporation Phase II Cerprobe inTest Corp. Electroglas National Semiconductor TestDesign Corp FormFactor Wentworth Labs Cascade Microtech Inc. Advanced Probing Systems EMPAC Design Rucker & Kolls Dallas Semiconductor Tribotech Alpine Microsystems Inc. ST-Microelectronics Cascade Microtech Electroglas Teradyne TSMC FormFactor ProMOS Technologies Univ. of California 408-864-5954 49-89-863-3373 913-393-1305 941-643-4400 941-643-4400 602-333-1500 602-892-5665 602-333-1701 408-730-9797 408-727-6500 [email protected] [email protected] [email protected] [email protected] [email protected] 408-730-1754 925-456-3904 203-775-0448 503-626-8245 303-939-9384 972-233-6339 408-934-9875 972-371-6393 707-643-2148 408-364-8000 X316 +33-476 92 64 23 510-440-8117 408-727-6500 X6361 818-991-2900 886-3-5675103 925-294-4300 886-3-566-3223 805-893-7294 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] cbui!ix.netcom.com [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Page 2 of 15 [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List Michael Chrastecky Alan Christie Chris Clark Doug Close Bill Corwith James Corzine Clarence (Gene) Cowan Larry Cowart Robert Coy Michael Craig Brett Crump Cindy Cruz Glenn Cunningham Rick Custance Kris Dabrowiecki Larry Dangremond John Darbyshire Herve Deshayes Cris Dewitt Michael Diamond Philip Diesing David Dix Richard Dock Pete Dodd Rob Drew Jack Eddings Michael Egloff Koichi Eguchi Ben Eldridge Wentworth Laboratories Wentworth Laboratoris Test & Manufacturing Resoruces TSK America Teradyne Teradyne Cascade Microtech Inc. Adaptec Rockwell Semiconductor Systems MJC Micronics Inc. Applied Precision Probe 2000 Intel Corp. ESH Probe Technology Cascade Microtech Probe 2000 SGS-Thomson Agile Probe Advantest IBM Advanced Micro Devices Cascade Microtech Inc. AMD Xandex CompuRoute RSJ Technical Sales Micronics Japan Co. FormFactor 203-775-0448 203-775-0448 408 354-5157 972-735-0880 617-422-2774 408-451-3283 503-626-8245 408-957-2364 619 535-3483 650-968-3531 425-557-1000 408-735-7396 602-715-2401 602-438-1112 408-980-1740 503-626-9246 408-735-7396 33 4 42 25 8905 512-292-8451 408-727-2222 x334 802-871-3548 512-602-5139 503-626-8245 512-602-2268 707-763-7799 x154 602-333-1500 512-292-8409 0422 21 0194 925-294-4300 Page 3 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] probe2000.msn.com [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List Paul M. Elizondo Michelle Ellison Martin Elzingrc Wolf Erben Gayn Erickson Juan Espinoza Steve Evans Pei Hsien Fang John Fayewicz Michael Fedler Andy Feinberg Thomas Ferrari W. Greg Flynn Thomas Foerster Len Foxman Teruaki Fujinaga Len Gaffney Rainer Gaggl Dean Gahagan Keith Gallen Bob Galmeister Brian Garrison Paul Geary Isabelle George Herbert Gerschwitz Jean-Claude Gery Michelle Gesse Tony Giallella Cliff Gibson Micro-Probe Xandex Inc. Electroglas MJC Micronics-APS Gmbh Hewlett-Packard PairGain Technologies Wentworth Laboratories New Wave Research Lucent Technologies Intel Cerprobe Corp. Fairchild Semiconductor Motorola Rockwell Semiconductor Eagle Test Systems Inc. Japan Elec. Materials Co. Xandex T.I.P.S Cascade Microtech Inc. ITC Micro-Probe Cerprobe ICT UPSYS Siemens AG UPSYS Advanced Probing Systems SV Probe Lockheed Martin 760-603-0631 X27 707-763-7799 x119 [email protected] [email protected] +49-89-8633373 408-553-6892 919 875-3372 203-775-0448 408-328-0220 610-939-7822 916-356-6315 602-333-1777 207 775-8466 512-933-8475 949-221-4620 847-367-8282 +81-6-482-8983 707-763-7799 -43-664-1054217 503-626-8245 602-968-3459 760-603-0631 602-333-1500 203-264-5757 33 1 60 90 58 11 +49-941-202-3789 33 1 60 90 58 51 303-939-9384 602-777-2866 703-367-5307 [email protected] [email protected] [email protected] Page 4 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] mgesse@advanced probing.com cliff.gibson.lmco.com Southwest Test Workshop Attendee List Larry Gilg Gene Ginoza Klaus Giringer Shannon Gladden David Glatley Dale Gleason Reed Gleason Mark K. Godfrey Ray Gore Kaoru Gotoh Daniel J. Graham David A Grano Walter Gray Brian Green Gary Griffin Neil Grinager Kurt Guthzeit Bob Hahnke Troy Harnisch Rob Harrison Yoshiei Hasegawa Roy Hatanaka Dieter Markus Hatner Jeff Hawkins Klaus Helmreich Dan Higgins Gary Higley Joe Hindes Karl Hodel MCC Probe & Test Feinmetall GmbH SV Probe Cerprobe Europe Hewlett-Packard Cascade Microtech Inc. Prime Yield Systems Teradyne Wentworth Japan inTEST Corp. KLA - Tencor Corp. Teradyne CLIC Schlumberger ATE Cerprobe Intel Advantest America Texas Instruments Richardson Tokyo Electron Ltd Micronics Japan Co Hughes Space & Comm Siemens Cascade Microtech Inc. Advantest (Europe) GmbH CerProbe STI Accuprobe Austria Mikro Sys.Int.Ag 512-338-3748 408-732-8576 49-7032-200-1140 408-441-4650 +44 1355 247897 970-898-7199 503 626-8245 612 407-7706 408-451-3279 045-912-8520 609 424-6886 x207 408-875-6495 408-451-3385 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] 408-501-7156 408-432-3900 X101 916-356-2063 602-855-4740 972-994-3630 408-566-4330 81-422-21-0194 310-364-7441 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] 503-626-8245 49 89 993 12 144 602-333-1710 732-780-2060 978-745-7878 +93 3136 500 196 Page 5 of 15 [email protected] david.grano@kla-tencor-com [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List Jochen Hoffmann Steve Hopkins Hyzy Hornyak Mark Hosman Mu-Chang Hou John Hsia Michael Hunter Kris Huston Al Hutton Takahiro Igarashi Toshinori Ishii Tetsuo Ishisoko Nasser Jafari Bill J. Jakobeit Keff Jhern Sam Jonaidi Mark Jones Ken Jones Jean-Michel Jurine Hy Kaplan Ken Karklin Heather Karklin Ivan Karolik Nao Katsuchi Funyu Kazumasa Kevin Keenapple James Kennedy Jae Keon Hong Jack Kessler Siemens Microelectronics Inc. Micro-Probe Advance Probe Schlumberger Technologies TSMC National Semiconductor Delphi Delco Elec. VTC Prime Yield Systems Micronics Japan Co. Ltd. Mitsubishi Materials Corp KLA-Tencor Intel Corp. Alphatech Rockwell Semiconductor Sys OZ Technologies Advantest Micro Module SYstems UPSYS TSK America Hewlett Packard Tokyo Electron America Lucent Technologies MMC Electronics America Tokyo Cathode Lab Dept. of Defense Kinetic Probe LLC Hyundai Electronic Ind. Amkor Technology Inc. 802-769-6037 760-603-0631 408-980-0460 408-501-7120 886-3-5781688x3204 408-721-6071 765-451-8923 612-853-3618 512-258-9961 422-21 0194 81-795-68-2320 408-875-6881 408-653-7181 512-458-9179 714-221-3109 510-782-2654 847-634-2552 408-864-5943 33 1 60 90 58 73 609-489-7725 408-533-6235 408-566-4351 609-639-2582 408-522-2600 ++3-3962-8311 301-688-5344 619-565-6665 82-336-39-1935 408-496-0303 Page 6 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List Ted Khoury Patrick Kiely Young Kim Ky Kim S.M. Kim SeHeon Kim Namsung Kim Ryuji Kimura David King January Jarek Kister Kathleen Kontur Doug Kopcso Daniel Kosecki Shinichiro Kozaki Wayne Kruger Patrick Kuhn Tony Kuki Belinda Kuo Rob LaNoce Michael Lapp Warren Latter Dusty Leavitt Ron Leckie Richard Lee Lawrence Lee Chung Meng Lee Lily Lee Carl Lee Douglas Lefever Advantest America Tokyo Electron America Teradyne Samsung Electronics FormFactor KES Korea Hyundai Electronic Ind. TSK America DOD Probe Technology Inc. Rockwell Micro-Probe Integrated Technology Japan Electronic Materials Electroglas Probe Technology Innotech Corp. Schlumberger Electroglas Lapp Technologies Gennum Corp. Cerprobe Corp. Strategic Test Partners Sun Microsystems ZMC Tech PTE Ltd. Stats Stats CLIC Motorola 847-634-2552 512-424-1331 408-441-2909 +82-2-760-7888 925-456-3915 +82-342-715-9480 82-336-39-1935 972-735-0880 301-688-4116 408-980-1740 949-221-7864 760-603-0631 X25 602-968-3459 968-26-4101 219-583-2690 408-980-1740 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] 408-453-3632 408-225-9980 512-467-6773 905-632-2999 X360 602-497-4224 408-255-0853 408-276-2654 65-285 1159 [email protected] [email protected] [email protected] belindak@san_jose.tt.slb.com [email protected] mlapp/[email protected] [email protected] [email protected] [email protected] [email protected] [email protected] 886-3-555-1771 512-933-3723 [email protected] [email protected] Page 7 of 15 Southwest Test Workshop Attendee List Dennis Legal Harry Leszczuk Justin Leung Don Levine Yung Wen Li Janusz Liberkowski Tamara Lilly Johnny Lim Ching Lin Jerry Lobacz Simon Longson Mario Lopez Roger Lorenzo Alan Loudermilk Susanne Lubash Marius Lupan Karen Lynch Joe Mai William R. Mann Nariman Manoocheri Roger Maraj Martin Martinez Dick Mason Peter Mathews Kazuya Matsushima Robert Matthiessen Randy McBride John McCarthy Lyndelle McCullough Cerprobe Lucent Technologies Intel CerProbe Corporation ChipMOS Technologies Inc. Tokyo Electron Ltd. TSK America Zen Voce Technology ITC Technology Taiwan Corp. AEHR Test Systems Teradyne Credence Systems Texas A&M University MicroConnect Intel Tokyo Electron Ltd Cerprobe JEM America Corp. Rockwell International Xandex AlliedSignal CerProbe Motorola FormFactor Inc NHK International Corp. inTest Corp. Hewlett-Packard Applied Precision SV Probe 602-333-1500 610-939-7025 408-653-7648 561-447-0688 886-3-566-8872 408-566-4414 408-245-8476 +65-4830280 886-3-552-7975 650-691-9400 818-874-7886 510-623-2531 409-845-6762 408-342-1866 503-591-2716 408-566-4427 602-333-1509 510-683-9234 x121 714-221-3132 707-763-7799 X115 410 964-4231 602-333-1770 714-450-6467 925-243-9300 408-492-9374 609-424-6886 707-577-2454 425-313-4556 408-441-4650 Page 8 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] kaz@#nhk.osdnet.com [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List Bruce McFadden Gay McFarren Heather McGill Michael McMenamin Randy Medina Greg Medrick Fred Megna Ron Mende Charles J. Michel Roger Milesi David Miley Ken Miller Fred Miller Al Miller Atsushi Mine Tadayuki Miyagawa Hitoshi Mizusugi Marla Mock Louis Molinari Yong Woo Moon Brian Moore Roger Morrison Patrick Morrison Dan Morrow Robert Most Alex Mouravieff Paul Mouravieff David Mroczka Robert Muir Cascade Microtech Inc. CerProbe Corporation Intel APEX America Inc. Probe Specialists CerProbe Corporation CerProbe Probe Technology Lucent Bell Labs ST Microelectronics DFW Test Hewlett-Packard Broadcom Intel-Massachusetts Japan Electronic Materials Corp. Micronics Japan Co. Ltd. Tokyo Electron Ltd. Keithley Instruments CerProbe DEMCO inTEST Ltd. Hewlett Packard Siemens NTS Pacific Western Systems Inc Bob Most Associates All-Points All-Points Prismark Partners Seagate Microelectronics 503-626-8245 512 445-6767 408-653-7847 503-968-5900 408-982-9123 602-333-1500 602-715-8352 408-980-1740 610-939-7807 +33 4 76 92 6449 972-231-1094 719-590-3719 714-450-8700 978-568-6143 +968-26-4101 422 21 0194 408-566-4347 440-498-2808 602-333-1579 82-32-674-0003 44-1844 217525 970-898-4817 44-191-280-4686 530-221-8855 973-697-0800 973-515-4440 201-515-4440 516-367-9187 +44-1506-416416 Page 9 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] miller@broadcom almiller@ [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List John Muir Jim Mulady Dan Murphy Tom Murphy Sae Bum Myung William Nace Suresh Nadig Michael Nakamura Noriaki Nakazaki Vinh Nguyen Bao Nguyen Viet Nguyen Sam Nishigori Nagano Noboru Ed North Kaz Okubo Naotake Okubo Harry Omata David Osborne Pam Otsuka Beth Pagano Ken Papworth Moo-Soon Park Frank Parrish Zafar Parvez Jean-Luc Pelissier Tammy Pelissier David Perniz Ivan Phillips Siemens NTS Ikonix IBM Accuprobe Advantest US Air Force Digital Equipment Corp. Rockwell Semiconductor Denka Corp. SV Probe Rockwell Semiconductor Systems Rockwell Semiconductor Systems ESJ Corp. Tokyo Cathode Lab New Wave Research JEM America Corp. Tokyo Cathode Laboratory ESJ Corp. Teradyne Ltd Hewlett-Packard Probe 2000 Motorola Inc. Apex International Inc. Teradyne Elite E/M Schlumberger TSK America Cerprobe Corp. Nortel Semiconductors 44-191-280-4680 510-939-7909 802-769-1783 978-745-7878 82-2-3452-7177 508-841-2973 714-221-4066 212-688-8700 408-441-4650 619-535-3390 81-6-395-0593 ++3-3962-8311 408-328-0220 510-683-9234 +44-13-3962-8884 81-43-244-5420 44-1344-725-847 707-577-4743 408-735-7396 602-655-5388 82-331-33-6366 818-874-7641 408-727-7092 408-437-5037 408-245-8476 408-432-3900 613-763-5065 Page 10 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List Frank Pietzschmann Gerald Piper Ann Potter Romi Pradhan Gary Puckett James Qubain Michael Quinn Jeffrey Quinton Rob Redeker Mike Rightley Patrick Riley Rey Rincon Bill Ritchie Patti Roberts Richard Rodriguez Pete Rogan Bryan Root James D. Ross Richard Roy Kevin Ryan Farzad Sadjadi Teruhisa Sakata Donna Sanford Takashi Sato Lynn Saunders Steve Scandalis Sharon Scannell Tony Schmitz Todd Schnack Siemens FormFactor Inc Analog Devices TSK America Rockwell Semiconductor Systems LSI Logic TSK America Delphi Delco Elec. Semtec bv Sandia National Labs. Electroglas Texas Instruments Symbios CerProbe Corporation Sigma Probe CerProbe Corporation Celadon Systems Inc. Teradyne FormFactor Inc Hewlett-Packard Advanced Micro Devices Japan Electronic Materials Test Design Tokyo Electron Yamanashi Ltd. MicroConnect Lockheed Martin Precision Probes Cypress Semiconductor Probe Technology 49-351-886-2032 910-605-4041 408-245-8476 619-535-3545 408 433-8089 972-735-0880 765-451-9466 31-24-3787876 505-845-3052 408-727-6500 X2023 972-917-4303 970 226-9000 602-333-1535 210-680-5754 602-333-1556 612-423-3170 408-441-3128 925-456-3810 719-590-3389 Fax: 512-602-4321 81-968-26-4101 602-456-6041 512-424-1399 (US) 503-647-9021 703-367-4420 303-530-0467 612-851-5217 408-980-1740 Page 11 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] rob@#emtec.nl [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] alley@ddencris [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List Stefan Schneidewind Vivianne Schoenecke Steve Schultz Rod Schwartz Stevon Scott Hank Scutoski Philip W. Seitzer Chander Sekar Kamran Shamsavari Dan Sheehan Jeffrey Shuey Roger Sinsheimer Dale Slaby David Sloat Jack Slote Sandra Small Ken Smith William O. Smith Don Smith Brad Snoulten Don Snow Ken Sokol Michael Sommer John Spano Jim Speedy James Spooner Nicholas Sporck R.P. St. Clair Dave Staats Karl Suss America American Microsystems Inc. Zilog Integrated Technology Corp. SGS-Thomson Microelectronics CerProbe Corp. Lucent Technologies CerProbe Corp. Xandex Analog Devices Lucent Technologies Xandex Inc. Cray Research/SGI Probe Technology Test Design Probe & Test Cascade Microtech Inc. Intel Xerox MOSAID Technologies Applied Precision Applied Precision Siemens White Oak Semiconductor Advanced Micro Devices Elite E/M OZ Technologies FormFactor Inc Teradyne Spirox CA 802-244-5181 208-233-4690 x6950 208-468-2795 602-968-3459 972-466-8239 602-333-1500 610-712-6529 602-333-1500 707-763-7799 353-61-229011 610-712-6166 707 763-7799 x124 715-726-4617 408-980-1740 408-730-1754 408-732-8576 503 626-8245 916-356-2319 650-812-4536 613-599-9539 X1207 206-557-1000 425-557-1000 804-952-7096 512 602-2269 408-727-7092 510-782-2654 925-456-3950 818-874-7252 408-739-3334 Page 12 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List Jacque Stewart Eric Strid John Strom Tom Strouth Eswar Subramanian Brian Summerhill Scot E. Swanson Todd Swart Timothy Swettlen Frank Swiatowiec Frederick L. Taber Hamid Tahriri Chin-Fa Tai Hiroyuki Takagi Toichi Takagi Masatomo Takahashi Mac Takano Danny Tam Ken Tang Ken Taoka Richard Taylor Terrell Teague Robert Templeton Raymond Texeira Colin Thompson James Tomer Hieu Ton Roberto Toscani Yoshiya Toyoshima CerProbe Corporation Cascade Microtech Inc. Applied Precision Gigatest Labs CerProbe Corporation SGS Thomson Sandia National Labs. Micro-Probe Intel MicroModule Systems IBM Corp. Rockwell SS ProMOS Technologies Tokyo Cathode Lab. Co. Ltd. Denka Corp. TSK America TSK America Broadcom Rockwell Semiconductor Sys Tokyo Electron America National Semiconductor Xerox Micro-Probe Cerprobe Corp. Seagate Electronics Rockwell Semiconductor Sys. Rockwell Semiconductor Sys ST Microelectronics Micronics Japan Co.Ltd 602-333-1599 503-626-8245 425-557-1000 408-996-7500 602-333-1500 602-485-2354 505-844-3729 760-603-0631 X22 408-653-7846 408-864-5958 914-894-2348 619 535 3438 886-3-566-3240 +3-3962-8311 212-688-8700 972-735-0880 503-692-8678 714-450-8700 949-221-5091 512-424-1339 408 721-6457 716-393-6707 760-603-0631 X19 408-432-3900 +44 1506 416416 714-221-6860 714-221-3094 +39-6035428 422 21 0194 Page 13 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] brianSummerhill_phx_st.com [email protected]. [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] hieutton/rss.rockwell@rss [email protected] [email protected] Southwest Test Workshop Attendee List Jack Tran Chi Tran Tom Trang Hendley Trinh Christian Troussieux Phill Truckle David Tuckerman Bahadir Tunaboylu David Unzicker Skip Van Loben Sels Larry Vandendriessche Boris Volf Fumio Wada Ken Walker Ronald Walrod Darwin Wamsley David Wanzenried Eric Watje Robert Watson Otto Weeden Christopher West Carol Whann Scott Williams Jim Williams Gerry Williams Ralph Williams Mark Wojcik Henry Wong Wgee (Henry) Wong Motorola Advance Probe Advance Probe Cerprobe Wentworth Laboratories CMEA Ventures Cerprobe Corp. Intel Xandex Applied Precision Teradyne Micronics Japan Co. Level One Kinetic Probe LLC Cerprobe CerProbe Corp. FormFactor Inc ST Assembly Test Services Cerprobe inTEST Corp. Micro-Probe CerProbe Corp. Xandex Rockwell Semiconductor Systems Technology To Go CerProbe Corp. Cerprobe Corp. Lucent Technology 512-933-3803 408-980-0460 408-474-5753 408-980-0460 408-570-3412 203-775-0448 415-352-1520 602-333-1736 916-356-6156 707-763-7799x148 425-557-1000 617-422-2050 650-968-1344 916-855-5000 619-485-8145 602-333-1500 602-333-1541 925-456-3945 781-890-7530 602-333-1702 609 424-6886 760-603-0631 13 602-333-1704 707-763-7799 619 535-3223 408-578-6256 602-333-1716 408-432-3900 407-371-6653 Page 14 of 15 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] Southwest Test Workshop Attendee List David Wood Ben Wu Michael Wurzman Hull Xu Jung Suk Yoo Takayuki Yoshida Douglas Young Johnson Young John Zimmel Rob Zokaei EMPAC Design Cerprobe Corp. RSJ Technical Hewlett-Packard DEMCO TSK America CerProbe Corporation Spirox Corp. Wentworth Laboratories Xandex 972-233-6339 408-432-3900 972-964-0981 707-577-2984 82-32-674-0003 512-834-4344 602-333-1500 [email protected] [email protected]. [email protected] [email protected] 203-775-0448 707-763-7799 [email protected] [email protected] Page 15 of 15 [email protected] [email protected]
