Committing SINS at the ALS : Ultra

Committing SINS at the ALS : Ultra-broadband
infrared nano-spectroscopy and imaging
Hans A. BECHTEL
(Advanced Light Source, Lawrence Berkeley National Laboratory, USA)
Lundi 11 avril 2016 – 14h00
Amphithéâtre SOLEIL
By combining scattering-type-scanning near-field optical microscopy (s-SNOM) with infrared
light from a synchrotron source, synchrotron infrared nano-spectroscopy (SINS) enables
sensitive molecular and phonon vibrational chemical imaging, spanning the mid- and farinfrared regions (300-5000 cm-1) with <25 nm spatial resolution. This highly powerful
combination provides access to a qualitatively new form of nano-chemometric analysis with
the investigation of nanoscale, mesoscale, and surface phenomena that were previously
impossible to study with IR techniques. We have installed a SINS end-station at Beamline 5.4
at the Advanced Light Source (ALS) at Lawrence Berkeley National Laboratory, making the sSNOM technique widely available to subject matter experts, such that it can be broadly
applied to biological, surface chemistry, materials, or environmental science problems. We
discuss recent applications of the SINS technique, highlighting the diverse user science
performed at this endstation.
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