Publications dans des revues à comité de lecture
Transcription
Publications dans des revues à comité de lecture
Publications dans des revues à comité de lecture "Purification and characterization of a novel glucuronan lyase from Trichoderma sp. GL2.", Delattre C., Michaud P., Keller C., Elboutachfaiti R., Beven L., Courtois B., Courtois J., 2006 Applied microbiology and biotechnology. 70 437-443 "Guest Editorial", Courtois B., 10.1007/s10470-005-2588-8 2005 Analog Integrated Circuits and Signal Processing August, Volume 44, Number 2 107 "A sweeping mode integrated fingerprint sensor with 256 tactile microbeams", Charlot B., Parrain F., Galy N., Basrour S., Courtois B., 10.1109/JMEMS.2004.832195 2004 Journal-of-Microelectromechanical-Systems 13(4) 636-44 "Guest Editorial", Courtois B., Korvink J.G., 10.1023/B:ALOG.0000032627.96167.ef 2004 Analog Integrated Circuits and Signal Processing August, Volume 40, Number 2 115-116 "Microsystem Technologies: Foreword to special issue on Design, Test, Integration and Packaging of MEMS/MOEMS, 2003", Courtois B., Michel B., 10.1007/s00542-004-0419-y 2004 Microsystem Technologies August, Volume 10, Number 5 345 "Simulation of ion propagation in the microbeam line of CENBG using GEANT4", Incerti S., Barberet P., Courtois B., Michelet-Habchi C., Moretto P., 10.1016/S0168-583X(03)01036-X "From Microelectronics to Integrated Microsystems Testing", Mir S., Charlot B., 2003 Nano et micro technologies Vol3/1-2 249-270 "Building an analogue fault simulation tool and its application to MEMS", Roman C., Mir S., Charlot B., 10.1016/S0026-2692(03)00162-9 2003 Microelectronics Journal 34(10) 897-906 "Analog Integrated Circuits and Signal Processing Foreword", Courtois B., 10.1023/A:1016079805767 2002 Analog Integrated Circuits and Signal Processing Volume 32, Number 1 5-5 "Studies of low molecular weight samples generated by ultrasonic treatment of glucuronans with various acetylation degree.", Pau-Roblot C., Petit E., Sarazin C., Courtois J., Courtois B., Barbotin J.N., Seguin J.P., 2002 Biopolymers 64 34-43 "A scalable multi-functional thermal test chip family: design and evaluation", Benedek Z., Courtois B., Farkas G., Kollar E., Mir S., Poppe A., Rencz M., Szekely V., Torki K., 10.1115/1.1389846 2001 Transactions of the ASME - Journal of Electornic Packaging 123(4) 323-30 "Generation of electrically induced stimuli for MEMS self-test", Charlot B., Mir S., Parrain F., Courtois B., 10.1023/A:1012860420235 2001 Journal of Electronic Testing: Theory and Applications 17(6) 459-70 "Fault simulation of MEMS using HDLs", Charlot B., Mir S., Courtois B., 2001 Journal of Modeling and Simulation of Microsystems 2(1) 35-42 "Generation of electrically induced stimuli for MEMS self-test", Charlot B., Mir S., Parrain F., Courtois B., 10.1023/A:1012860420235 2001 Journal-of-Electronic-Testing:-Theory-and-Applications. Dec. 17(6) 459-70 "Fault simulation of MEMS using HDLs", Charlot B., Mir S., Courtois B., 2001 Journal-of-Modeling-and-Simulation-of-Microsystems 2(1) 35-42 "Guest Editorial", Courtois B., 10.1023/A:1011242326400 2001 Analog Integrated Circuits and Signal Processing October, Volume 29, Numbers 1-2 5-6 "Design of an APS CMOS Image Sensor for Low Light Level Applications Using Standard CMOS Technology", Courtois B., Karam J.M., Goy J., Pressecq F., 2001 Analog Integrated Circuits and Signal Processing Volume 29 , Issue 1-2 October-November 2001 95 - 104 "Deformable magnetic mirror for adaptive optics: technological aspects", Cugat O., Basrour S., Divoux C., Mounaix P., Reyne G., 10.1016/S0924-4247 2001 Sensors and Actuators A 89, issues 1-2 1-9 "Design of an APS CMOS Image Sensor for Low Light Level Applications Using Standard CMOS Technology", Goy J., Courtois B., Karam J.M., Pressecq F., 10.1023/A:1011286415014 2001 Analog-Integrated-Circuits-and-Signal-Processing Oct.-Nov. 29(1-2) 95-104 "Microbeams with electronically controlled high thermal impedance", Mir S., Parrain F., Charlot B., Veychard D., 10.1023/A:1011282314105 2001 Analog Integrated Circuits and Signal Processing 29(1-2) 71-83 "THERMODEL: A Tool for Thermal Model Generation, and Application for MEMS", Szekely V., Rencz M., Poppe A., Courtois B., 10.1023/A:1011226213197 2001 Analog Integrated Circuits and Signal Processing October, Volume 29, Numbers 1-2 49-59 "THERMODEL: A Tool for Thermal Model Generation, and Application for MEMS", Szekely V., Courtois B., Poppe A., Rencz M., 10.1023/A:1011226213197 2001 Analog Integrated Circuits and Signal Processing Volume 29, Numbers 1-2 49 - 59 "Measurement of residual stresses in a plate using bulging test and a dynamic technique: application to electroplated nickel coatings", Basrour S., Robert L., Delobelle P., 10.1016/S0921-5093 2000 Materials Science and Engineering 288, issue 2 160-163 "X-ray characterization of residual stresses in electroplated nickel used in LIGA technique", Basrour S., Robert L., 10.1016/S0921 2000 Materials Science and Engineering 288, Issue 2 270-274 "Analog ALC crystal oscillators for high-temperature applications", Bianchi R.A., Karam J.M., Courtois B., 10.1109/4.818915 2000 IEEE-Journal-of-Solid-State-Circuits 35(1); Janv. 2000 2-14 "ALC crystal oscillators based pressure and temperature measurement integrated circuit for high temperature oil well applications", Bianchi R.A., Karam J.M., Courtois B., 10.1109/58.869071 2000 IEEE-Transactions-on-Ultrasonics,-Ferroelectrics-and-Frequency-Control Sept. 2000; Volume: 47, Issue: 5 1241-1245 "CMOS-compatible temperature sensor with digital output for wide temperature range applications", Bianchi R.A., Karam J.M., Courtois B., Nadal R., Pressecq F., Sifflet S., 10.1016/S0026-2692(00)00062-8 2000 Microelectronics-Journal Sept. -Oct. 31(9-10): 803-10 "Design of self-checking fully differential circuits and boards", Lubaszewski M., Mir S., Kolarik V., Nielsen C., Courtois B., 10.1109/92.831432 2000 IEEE Transactions on Very Large Scale Integration VLSI Systems 8(2): April 113-28 "Extending fault-based testing to microelectromechanical systems", Mir S., Charlot B., Courtois B., 10.1023/A:1008303717862 2000 Journal of Electronic Testing: Theory and Applications 16(3): June 279-88 "Extending Fault-Based Testing to Microelectromechanical Systems", Mir S., Charlot B., Courtois B., 10.1023/A:1008303717862 2000 Journal of Electronic Testing une 2000, Volume 16, Number 3 279-288 "Extending Fault-Based Testing to Microelectromechanical Systems", Mir S., Charlot B., Courtois B., 10.1023/A:1008303717862 2000 Journal of Electronic Testing Volume 16, Number 3, June 279 - 288 "Microsystems for space applications", Palan B., Santos F.V., Courtois B., Husak M., 2000 Acta-Polytechnica,-Czech-Technical-University-in-Prague 40(3) 53-7 "IDDQ Testing of Submicron CMOS#by Cooling?", Rencz M., Szekely V., Töröka S., Torki K., Courtois B., 10.1023/A:1008364515030 2000 Journal of Electronic Testing October, Volume 16, Number 5 453-461 "The morphology and electrochemical behavior of electrodeposited nickel onto metallized silicon", Robert L., Basrour S., Wery M., Sittler F., 2000 Plating-and-Surface-Finishing 87(5) 153-9 "New approaches in the transient thermal measurements", Szekely V., Ress S., Poppe A., Töröka S., Magyari D., Benedek Z., Torki K., Courtois B., Rencz M., 10.1016/S0026-2692(00)00051-3 2000 Microelectronics Journal Volume 31, Issues 9-10 , October 727-733 "Fault simulation of MEMS using HDLs", Charlot B., Mir S., Courtois B., 1999 Journal of Modeling and Simulation of Microsystems 1(1) 8 "Fault simulation of MEMS using HDLs", Charlot B., Courtois B., Mir S., 1999 Journal-of-Modeling-and-Simulation-of-Microsystems 1(1) 8 "Guest Editors' Introduction", Courtois B., Blanton R.D., 10.1109/MDT.1999.808199 1999 IEEE Design & Test of Computers Volume: 16 , Issue: 4 16-17 "Design of self-checking fully differential circuits and boards", Lubaszewski M., Mir S., Kolarik V., Nielsen C., Courtois B., 10.1109/92.831432 1999 IEEE-Transactions-on-Very-Large-Scale-Integration-VLSI-Systems 2 1058-1061 vol.2 "Dynamic determination of Young's modulus of electroplated nickel used in LIGA technique", Majjad H., Basrour S., Delobelle P., Schmidt M., 10.1016/S0924-4247 1999 Sensors and Actuators A A74(1-3) 148-51 "On the integration of design and test for chips embedding MEMS", Mir S., Charlot B., 10.1109/54.808204 1999 IEEE Design and Test Computers 16(4) 28-38 "Sensor interface circuit for ISFET based sensors", Palan B., Vinci-Dos-Santos F., Karam J.M., Courtois B., Husak M., 1999 Journal-of-Solid-State-Devices-and-Circuits 7(1); feb. 1999 17-23 "A step forward in the transient thermal characterization of chips and packages", Szekely V., Rencz M., Courtois B., 10.1016/S0026-2714(98)00198-X 1999 Microelectronics and Reliability 39(1):; Jan. 1999 89-96 "Thermal monitoring and testing of electronic systems", Szekely V., Rencz M., Pahi A., Courtois B., 10.1109/6144.774737 1999 IEEE-Transactions-on-Components-and-Packaging-Technologies 22 Issue 2; June 1999 231 - 237 "CMOS-compatible smart temperature sensors", Bianchi R.A., Dos-Santos F.V., Karam J.M., Courtois B., Pressecq F., Sifflet S., 10.1016/S0026-2692(98)00026-3 1998 Microelectronics Journal September 1998 627-636 "CMOS compatible temperature sensor based on the lateral bipolar transistor for very wide temperature range applications", Bianchi R.A., Dos-Santos F.V., Karam J.M., Courtois B., Pressecq F., Sifflet S., 1998 Sensors-and-Actuators-A-Physical Nov. 1998; A71(1-2): 3-9 "CAD tools and foundries to boost microsystems development", Courtois B., Karam J.M., Lubaszewski M., Szekely V., Rencz M., Hofmann K., Glesner M., 1998 Materials-Science-&-Engineering-B-Solid-State-Materials-for-Advanced-Technology 7 Feb. 1998; B51(1-3): 242-53 "Deformable mirror using magnetic membranes: application to adaptive optics in astrophysics", Divoux C., Cugat O., Reyne G., Boussey-Said J., Basrour S., 10.1109/20.717841 1998 IEEE Transactions on Magnetics 34(5) 3564-7 "A Reliable Fail-Safe System", Lubaszewski M., Courtois B., 10.1109/12.663771 1998 IEEE Transactions on Computers February 1998; Vol. 47, No. 2 236-241 "Reliable fail-safe systems", Lubaszewski M., Courtois B., 10.1109/12.663771 1998 IEEE Transactions on Computers February 1998 ; Vol. 47, No. 2 236-241 "An electrostatic microactuator using LIGA process for a magnetic head tracking system of hard disk drives", Nakamura S., Suzuki K., Ataka M., Fujita H., Basrour S., Soumann V., De-Labachelerie M., 10.1007/s005420050144 1998 Microsystem Technologies 5(2) 69-71 "Micromachined planar spiral inductor in standard GaAs HEMT MMIC technology", Ribas R.P., Lescot J., Leclercq J.L., Bennouri N., Karam J.M., Courtois B., 10.1109/55.704401 1998 IEEE-Electron-Device-Letters Aug. 1998; 19(8) 285-7 "Study of suspended microstrip and planar spiral inductor built using GaAs compatible micromachining", Ribas R.P., Bennouri N., Karam J.M., Courtois B., 1998 Journal-of-Solid-State-Devices-and-Circuits Feb. 1998; 6(1) 11-16 "Tracing the Thermal Behavior of ICs", Szekely V., Rencz M., Courtois B., 10.1109/54.679204 1998 IEEE Design and Test of Computers April-June 1998 ; Vol. 15, No. 2 14-21 "Thermal monitoring of self-checking systems", Szekely V., Rencz M., Karam J.M., Lubaszewski M., Courtois B., 10.1023/A:1008233907036 1998 Journal-of-Electronic-Testing:-Theory-and-Applications Feb.-April 1998; Volume 12, Numbers 1-2 81-92 "Microgrippers fabricated by the LIGA technique", Ballandras S., Basrour S., Robert L., Megtert S., Blind P., Roulliay M., Bernede P., Daniau W., 10.1016/S0924-4247(97)01396-4 1997 Sensors and Actuators A Vol.58, Issue 3 265-272 "Access to microsystem technology: the CMP services solution", Courtois B., 10.1016/S0026-2692(96)00066-3 1997 Microelectronics Journal Volume 28, Issue 4 , May 1997 407-417 "CAD tools for bridging microsystems and foundries", Karam J.M., Courtois B., Boutamine H., 10.1109/54.587739 1997 IEEE-Design-&-Test-of-Computers April-June 1997 (Vol. 14, No. 2) 34-39 "Thermal transient testing", Szekely V., Microelectronics-International May 1997; (43) 8-10 Rencz M., Courtois B., 1997 "Cooling as a possible way to extend the usability of I/sub DDQ/ testing", Szekely V., Rencz M., Töröka S., Courtois B., 1997 Electronics-Letters 4 Dec. 1997; 33(25) 2117-2118 "Fault-based testing and diagnosis of balanced filters", Courtois B., Kolarik V., Lubaszewski M., Mir S., 1996 Analog Integrated Circuits and Signal Processing 11(1): September 5-19 "Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets", Courtois B., Lubaszewski M., Mir S., 1996 Journal of Electronic Testing: Theory and Applications 9(1-2) 43-57 "Unified built-in self-test for fully differential analog circuits", Courtois B., Lubaszewski M., Mir S., 1996 Journal of Electronic Testing: Theory and Applications 9(1-2) 135-51 "Second Therminic Workshop", Courtois B., 10.1109/MDT.1996.10025 1996 IEEE Design and Test of Computers Winter 1996 (Vol. 13, No. 4) 5 "Guest editorial", Kaminska B., Courtois B., 10.1007/BF00137560 1996 Journal of Electronic Testing (Historical Archive) August, Volume 9, Numbers 1-2 7-8 "Guest Editors' Introduction: Mixed Analog and Digital Systems", Kaminska B., Courtois B., 10.1109/MDT.1996.500195 1996 IEEE Design and Test of Computers Summer 1996 (Vol. 13, No. 2) 8-9 "Collective fabrication of gallium-arsenide-based microsystems", Karam J.M., Courtois B., Holjo M., Leclercq J.L., Viktorovitch P., 10.1117/12.251219 1996 Proceedings of SPIE 2879 315-26 "Microsystem design framework based on tool adaptations and library developments", Karam J.M., Courtois B., Rencz M., Poppe A., Szekely V., 10.1117/12.250956 1996 Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering 2880 236-245 "Unified built-in self-test for fully differential analog circuits", Mir S., Lubaszewski M., Courtois B., 10.1007/BF00137570 1996 Journal of Electronic Testing (Historical Archive) August, Volume 9, Numbers 1-2 135-151 "Fault-based testing and diagnosis of balanced filters", Mir S., Lubaszewski M., Kolarik V., Courtois B., 10.1007/BF00174235 1996 Analog Integrated Circuits and Signal Processing (Historical Archive) September, Volume 11, Number 1 5-19 "Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets", Mir S., Lubaszewski M., Courtois B., 10.1007/BF00137564 1996 Journal-of-Electronic-Testing:-Theory-and-Applications. August 1996 ; Volume 9, Numbers 1-2 43 - 57 "Design for thermal testability (DfTT) and a CMOS realization", Szekely V., Marta C., Rencz M., Benedek Z., Courtois B., 1996 Sensors-and-Actuators-A-Physical 15 July 1996; A55(1) 29-33 "Deep etch X-ray lithography using silicon-gold masks fabricated by deep etch UV lithography and electroforming", Ballandras S., Daniau W., Basrour S., Robert L., Roulliay M., Blind P., Bernede P., Robert D., Rocher S., Hauden D., Megtert S., Labeque A., Zewen L., Dexpert H., Comes R., Rousseaux F., Ravet M.F., Launois H., 10.1088/0960-1317/5/3/001 1995 Journal of Micromechanics and Microengineering Vol.5, Issue 3 203-8 "LIGA technique application in micro-optics", Basrour S., Ballandras S., Hauden D., 1995 Annales de Physique Vol.20, Issue 5-6 693-700 "Conference Reports", Chakravarty S., Sridhar R., Upadhyaya S., Zorian Y., Philips G., Kaminska B., Courtois B., 10.1109/MDT.1995.10029 1995 IEEE Design and Test of Computers Winter 1995 (Vol. 12, No. 4) 95-97 "Analog checkers with absolute and relative tolerances", Courtois B., Kolarik V., Lubaszewski M., Mir S., 1995 IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems 14(5): May 607-12 "Fabrication of an electrostatic wobble micromotor using deep-etch UV lithography, nickel electroforming and a titanium sacrificial layer", Daniau W., Ballandras S., Kubat L., Hardin J., Martin G., Basrour S., 10.1088/0960-1317/5/4/002 1995 Journal-of-Micromechanics-and-Microengineering Vol.5, Issue4 270-5 "Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers", Hellebrand S., Rajski J., Tarnick S., Venkataraman S., Courtois B., 10.1109/12.364534 1995 IEEE Transactions on Computers February 1995 Vol. 44, No. 2 223-233 "Collective fabrication of microsystems compatible with CMOS through the CMP service", Karam J.M., Courtois B., Paret J.M., 10.1016/0921-5107(95)01337-7 1995 Materials-Science-&-Engineering-B-Solid-State-Materials-for-Advanced-Technology December 1995; Volume 35, Issues 1-3 219-223 "Analog checkers with absolute and relative tolerances", Kolarik V., Mir S., Lubaszewski M., Courtois B., 10.1109/43.384424 1995 IEEE-Transactions-on-Computer-Aided-Design-of-Integrated-Circuits-and-Systems Volume: 14, Issue: 5 607-612 "CAD framework concept for the design of integrated microsystems", Poppe A., Rencz M., Szekely V., Karam J.M., Courtois B., Hofmann K., Glesner M., 10.1117/12.221171 1995 Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering. September 1995; 2642 215-224 "Multi project chip service in France", Courtois B., Journal-of-the-Institute-of-Electronics,-Information-and-Communication-Engineers 1994; 77(1) 46-51 1994 Jan. "CAD and testing of ICs and systems: where are we going?", Courtois B., 1994 Journal-of-Microelectronic-Systems-Integration. Sept. 1994; 2(3) 139-201 "Deep etch lithography at LURE-D.C.I. storage ring", Megtert S., Labeque A., Liu Z.W., Dexpert H., Comes R., Rousseaux F., Ravet M.F., Launois H., Ballandras S., Daniau W., Basrour S., Roulliay M., Blind P., Hauden D., 1994 Journal de Physique IV Colloque 4(C9) 269-72 "Electronic systems CAD", Bayle P., Courtois B., Dana M., 1993 L'Onde-Electrique. Nov.-Dec. 1993; 73(6) 25-31 "A study of structural phase transitions by infrared spectroscopy of vibrational excitons: application to crystalline phenothiazine", Guerin R., Courtois B., Rezzouk A., Le-Roy A., 1993 Comptes-Rendus-de-l'Academie-des-Sciences Serie-II-Mecanique,-Physique,-Chimie-Sciences-de-la-Terre-et-de-l'Univers. 18 Feb. 1993; 316(4) 441-8 "Design of built-in current sensors for concurrent checking in radiation environments", Nicolaidis M., Vargas F., Courtois B., 10.1109/23.273553 1993 IEEE Transactions on Nuclear Science Dec. ; 40(6) pt. 1 1584-90 "Design of built-in current sensors for concurrent checking in radiation environments", Nicolaidis M., Vargas F., Courtois B., 10.1109/23.273553 1993 IEEE-Transactions-on-Nuclear-Science Volume: 40 , Issue: 6 , Part 1-2 1584 - 1590 "Multiple adjacent image processing for automated failure location using electron beam testing [VLSI]", Conard D., D. Russell J., Laurent J., Courtois B., Skaf A., 10.1016/0026-2714(92)90463-U 1992 Microelectronics and Reliability Volume 32, Issue 11 , November 1992 1615-1620 "E-beam testing using multiple adjacent image processing for prototype validation", Russell J. D., Vargas F., Courtois B., 10.1016/0167-9317(92)90362-U 1992 Microelectronic Engineering Volume 16, Issues 1-4 , March 1992 413-420 "Chemical bonds and spin properties of a-Si/sub x/Ge/sub y/:H/sub z/ alloys", Basrour S., Bustarret E., Bruyere J.C., 10.1016/0040-6090(91)90304-G 1991 Thin Solid Films 205(2) 223-6 "Nature of deep defects in bulk VHF-GD a-Si:H", Favre M., Shah A., Hubin I., Bustarret E., Hachicha M.A., Basrour S., 10.1016/S0022-3093(05)80124-3 1991 Journal of Non Crystalline Solids 137-138 pt.1 335-8 "Band tails and deep-defect density of states in hydrogenated amorphous germanium", Godet C., Bouizem Y., Chahad L., El-Zawawi I., Theye M.L., Meaudre M., Meaudre R., Basrour S., Bruyere J.C., 1991 Physical Review B 44(11) 5506-9 "Photoconductivity and fluorescence properties of divalent ytterbium ions in fluoride crystals", Moine B., Courtois B., Pedrini C., 10.1016/0022-2313(91)90179-Y 1991 Journal of Luminescence Volumes 48-49, Part 2 , January-February 1991 501-504 "Photoionization and luminescences in BaF/sub 2/:Eu/sup 2", Moine B., Courtois B., Pedrini C., 10.1016/0022-2313(91)90007-I 1991 Journal of Luminescence Volume 50, Issue 1 , May-June 1991 31-38 "Silicon compilation of hierarchical control sections with unified BIST testability", Nicolaidis M., Torki K., Jerraya A.A., Courtois B., 10.1016/0141-9331(91)90067-P 1991 Microprocessors and Microsystems June ; 15(5) 257-69 "Failure analysis using E-beam", Collin J., Conard D., Courtois B., Denis P., Savart D., 10.1016/0167-9317(90)90045-U 1990 Microelectronic Engineering Volume 12, Issues 1-4 , May 1990 305-324 "High-level tools and methods for electron-beam debug and failure analysis of integrated circuits", Conard D., Courtois B., Laurent J., Marzouki M., 1990 Periodica-Polytechnica 34(4) 281-304 "Fluorescence, photoconductivity and polarization properties of divalent rare earth ions in fluoride crystals", Moine B., Courtois B., Pedrini C., 10.1016/0022-2313(90)90159-9 1990 Journal of Luminescence Volume 45, Issues 1-6 , January-February 1990 248-250 "Random Pattern Testing Versus Deterministic Testing of RAMs", David R., Fuentes A., Courtois B., 10.1109/12.24267 1989 IEEE Transactions on Computers May 1989 (Vol. 38, No. 5) 637-650 "The SYCO silicon compiler", Jerraya A.A., Courtois B., Mhaya N., Jamier R., Geronimi J., Bekkara N., 1989 Technique-et-Science-Informatiques 8(6) 489-507 "Luminescence and photoionization processes of Yb/sup 2+/ in CaF/sub 2/, SrF/sub 2/ and BaF/sub 2/", Moine B., Courtois B., Pedrini C., 1989 Journal de Physique Aug. ; 50(15) 2105-19 "Self-checking logic arrays", Nicolaidis M., Courtois B., 1989 Microprocessors and Microsystems May; 13(4) 281-90 "Definition and design of strongly language disjoint checkers", Jansch I., Courtois B., 10.1109/12.2215 1988 IEEE Transactions on Computers June; 37(6) 745-8 "SYCO-a silicon compiler for VLSI ASICs specified by algorithms", Jerraya A.A., Mhaya N., Geronimi J., Courtois B., 1988 Computer Aided Engineering Journal 5(3): June 122-30 "Strongly code disjoint checkers", Nicolaidis M., Courtois B., 10.1109/12.2217 1988 IEEE Transactions on Computers June ; 37(6) 751-6 "Strongly Code Disjoint Checkers", Nicolaidis M., Courtois B., 10.1109/12.2217 1988 IEEE Transactions on Computers June 1988 (Vol. 37, No. 6) 751-756 "An integrated debugging system based on E-beam test", Guiguet I., Marzouki M., Courtois B., 10.1016/S0167-9317(87)80022-9 1987 Microelectronic Engineering 7(2-4) 275-82 "Design methods of electron beam sensitive devices in NMOS and CMOS technologies", Micollet D., Courtois B., 10.1016/S0167-9317(87)80038-2 1987 Microelectronic Engineering 7(2-4) 419-26 "Automatic failure of analysis of VLSI circuits using E-beam", Savart D., Courtois B., 10.1016/S0167-9317(87)80020-5 1987 Microelectronic Engineering 7(2-4) 259-66 "Testing CMOS: a challenge", Baschiera D., Courtois B., 1984 VLSI Design Oct. ; 5(10) 58-62 "A new domain for image analysis: VLSI circuits testing, with ROMUALD, specialized in parallel image processing", Rubat-Du-Merac C., Jutier P., Laurent J., Courtois B., 10.1016/0167-8655(83)90074-0 1983 Pattern recognition letters July ; 1(5-6) 347-57 "SKALP: skeleton architecture for fault-tolerant distributed processing", Courtois B., Marinescu M., Pons J.-F., 1981 Microprocessing-&-Microprogramming May ; 7(5) 312-25 "Safety, availability, and maintenance evaluation for redundant systems", Courtois B., 1981 Digital Processes 7(1) 47-64 "Safety and reliability of non-repairable systems", Courtois B., 1976 Digital-Processes Winter ; 2(4) 341-6 Proceedings à comité de lecture "Global simulation and co-simulation of Self Powered Micro Systems", Ammar Y., Basrour S., Zenati A., Matou K., Cusinu P., 2005 178-181 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'05), June 1-3 TIMA Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'05), June 1-3 "Design and fabrication of piezoelectric micro power generators for autonomous microsystems", Basrour S., Charlot B., Marzencki M., Grasso A., Colin M., Valbin L., 2005 299-302 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'05), June 1-3 TIMA Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'05), June 1-3 "Fabrication and characterization of high damping electrostatic micro devices for vibration energy scavenging", Basrour S., Chaillout J.J., Charlot B., Despesse G., Jager T., Leger J.M., Vassilev A., 2005 386-390 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2005), June 1-3 TIMA Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2005), June 1-3 "High Damping Electrostatic System For Vibration Energy Scavenging", Basrour S., Charlot B., Despesse G., Chaillout J.J., Dekkaki I., Jager T., Leger J.M., Vassilev A., 2005 375 - 378 Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show NSTI Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show "Design, Modelling and Optimisation of Integrated Piezoelectric Micro Power Generators", Basrour S., Charlot B., Marzencki M., 2005 545 - 548 Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3 NSTI Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3 "5B:Emerging technologies - reliable and fault-tolerant wireless sensor networks", Courtois B., Kaminska B., 10.1109/VTS.2005.16 2005 173 IEEE Comput. Soc, Los Alamitos, CA, USA 23rd-IEEE-VLSI-Test-Symposium. 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Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "Electro-thermal simulation for the prediction of chip operation within the package", Rencz M., Szekely V., Poppe A., Torki K., Courtois B., 2003 168-75 IEEE, Piscataway, NJ, USA Nineteenth-Annual-IEEE-Semiconductor-Thermal-Measurement-and-Management-Symposium-Cat.-N "Boundary condition independent dynamic compact models of packages and heat sinks from thermal transient measurements", Rencz M., Farkas G., Szekely V., Poppe A., Courtois B., 2003 479-84 IEEE, Piscataway, NJ, USA Proceedings-of-the-5th-Electronics-Packaging-Technology-Conference-EPTC-2003 "A methodology for the generation of dynamic compact models of packages and heat sinks from thermal transient measurements", Rencz M., Farkas G., Poppe A., Szekely V., Courtois B., 2003 117-23 IEEE, Piscataway, NJ, USA IEEE/CPMT/SEMI.-28th-International-Electronics-Manufacturing-Technology-Symposium-Cat.-No.03C "Algorithmic and modeling aspects in the electro-thermal simulation of thermally operated microsystems", Rencz M., Szekely V., Poppe A., Courtois B., 2003 476-9 vol.2 Computational Publications, Cambridge, MA, USA 2003-Nanotechnology-Conference-and-Trade-Show.-Nanotech-2003.-Nanotech-2003-Joint-Meeting."Electro-thermal simulation of MEMS elements", Rencz M., Szekely V., Poppe A., Courtois B., 2003 15-20 IEEE, Piscataway, NJ, USA Design,-Test,-Integration-and-Packaging-of-MEMS/MOEMS-2003-IEEE-Cat.-No.03EX713 "Access to microsystem technology: the CMP services solution", Charlot B., Courtois B., Delori H., Paillotin J.F., Torki K., 2002 47-53 vol.1 IEEE, Piscataway, NJ, USA 2002-23rd-International-Conference-on-Microelectronics.-Proceedings-Cat.-No.02TH8595 "Application-specific architecture for quantum cellular automata", Ciontu F., Courtois B., Cucu C., 2002 351-4 IEEE, Piscataway, NJ, USA Proceedings-of-the-2002-2nd-IEEE-Conference-on-Nanotechnology-Cat.-No.02TH8630 "SystemC-based cosimulation for global validation of MOEMS", Kriaa L., Youssef W., Nicolescu G., Martinez S., Levitan S., Martinez J., Kurzweg T., Jerraya A.A., Courtois B., 2002 4755: 64-70 SPIE-Int. 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Soc. Opt. Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "Simulation and Characterization of High Q Microresonators Fabricated by UV # LIGA", Basrour S., Coudevylle J.R., De-Labachelerie M., Majjad H., 2001 294 - 297 Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems NSTI Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems "Design and test of new high Q microresonators fabricated by UV-LIGA", Basrour S., Majjad H., Coudevylle J.R., De-Labachelerie M., 10.1117/12.425337 2001 4408: 310-16 Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering SPIE-Int. Soc. Opt. Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "Electrically induced stimuli for MEMS self-test", Charlot B., Mir S., Parrain F., Courtois B., 10.1109/VTS.2001.923441 2001 210-15 Proceedings-19th-IEEE-VLSI-Test-Symposium.-VTS- IEEE Comput. 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Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "Guest Editorial", Courtois B., 2001 Volume 29 , Issue 1-2 October-November 2001, Pages: 5 - 6 Kluwer Academic Publishers Hingham, MA, USA Analog Integrated Circuits and Signal Processing "Design and test of an active pixel sensor (APS) for space applications", Goy J., Courtois B., Karam J.M., Pressecq F., 10.1117/12.426945 2001 4306: 93-9 SPIE-Int. Soc. Opt. Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "MEMS synthesis and optimization", Juneidi Z., Torki K., Charlot B., Courtois B., 10.1117/12.425364 2001 4408; 159-64 SPIE-Int. Soc. Opt. 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Soc. Opt. Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "THERMODEL: a tool for thermal model generation and application for MEMS packages", Szekely V., Rencz M., Poppe A., Courtois B., 10.1117/12.382288 2000 4019; 39-49 SPIE-Int. Soc. Opt. Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "New hardware tools for the thermal transient testing of packages", Szekely V., Rencz M., Poppe A., Courtois B., 10.1109/EPTC.2000.906348 2000 46-52 IEEE, Piscataway, NJ, USA Proceedings-of-3rd-Electronics-Packaging-Technology-Conference-EPTC-2000-Cat.-No.00EX456. 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Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "Extending fault-based testing to microelectromechanical systems", Mir S., Charlot B., Courtois B., 10.1109/ETW.1999.804234 1999 64-8 European-Test-Workshop-1999-Cat.-No.PR00390 IEEE Comput. Soc, Los Alamitos, CA, USA European-Test-Workshop-1999-Cat.-No.PR00390 "Extending fault-based testing to microelectromechanical systems", Mir S., Charlot B., Courtois B., 10.1109/ETW.1999.804234 1999 64-8 IEEE Comput. Soc, Los Alamitos, CA, USA European-Test-Workshop-1999-Cat.-No.PR00390 "New ISFET sensor interface circuit for biomedical applications", Palan B., Santos F.-V., Karam J.M., Courtois B., Husak M., 1999 7 Sept. 1999; B57(1-3): 63-8 Elsevier Sensors-and-Actuators-B-Chemical "Providing technology infrastructure for MEMS", Ribas R.P., Veychard D., Karam J.M., Courtois B., 10.1117/12.341213 1999 3680 pt. 1-2: 298-305 SPIE-Int. Soc. Opt. Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "New way for thermal transient testing [IC packaging]", Szekely V., Rencz M., Poppe A., Courtois B., 1999 182-8 IEEE, Piscataway, NJ, USA Fifteenth-Annual-IEEE-Semiconductor-Thermal-Measurement-and-Management-Symposium-Cat.-No "Simulation, testing and modeling of the thermal behavior and electro-thermal interactions in ICs, MCMs and PWBs", Szekely V., Rencz M., Courtois B., 10.1109/SSMSD.1999.768612 1999 168-73 IEEE, Piscataway, NJ, USA Mixed-Signal Design, 1999. SSMSD '99. 1999 Southwest Symposium on "Tool and method for the thermal transient evaluation of packages", Szekely V., Rencz M., Courtois B., 10.1117/12.368429 1999 3893: 94-103 SPIE-Int. Soc. Opt. Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "Transient thermal measurements for dynamic package modeling: new approaches", Szekely V., Ress S., Poppe A., Töröka S., Magyari D., Benedek Z., Torki K., Courtois B., Rencz M., 1999 7-11 TIMA Lab, Grenoble, France 5th-International-Workshop-Thermal-Investigations-of-ICs-and-Systems "Advanced low cost manufacturing from CMP service", Torki K., Courtois B., 10.1109/MSE.1999.787009 1999 4-5 IEEE Comput. Soc, Los Alamitos, CA, USA IEEE International Conference on Microelectronic Systems Education, 1999. MSE '99. "3D CMOS SOI for high performance computing", Abou-Samra S.J., Aisa P.A., Guyot A., Courtois B., 10.1145/280756.280783 1998 54 - 58 ACM, New York, NY, USA International Symposium on Low Power Electronics and Design "Miniaturized deformable magnetic mirror for adaptive optics", Basrour S., Boussey-Said J., Cugat O., Divoux C., Mounaix P., Kern P., 1998 850-857 Int. Symp. on Astronomical Telescopes and Instrumentation. SPIE Int. Symp. on Astronomical Telescopes and Instrumentation. "Failure Mechanisms and Fault Classes for CMOS-Compatible Microelectromechanical Systems", Castillejo A., Veychard D., Karam J.M., Mir S., Courtois B., 10.1109/TEST.1998.743197 1998 541 Proceedings International Test Conference 1998 IEEE Computer Society Proceedings International Test Conference 1998 "An integrated mixed-technology design environment to support micro electro mechanical systems development", Karam J.M., Courtois B., Cao A., Hofmann K., 10.1117/12.323899 1998 3514: 278-86 SPIE-Int. Soc. Opt. Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "Microsystems testing: an approach and open problems", Lubaszewski M., Cota E.F., Courtois B., 10.1109/DATE.1998.655908 1998 524 - 529 Design, Automation, and Test in Europe archive Proceedings of the conference on Design, automation and test in Europe "A new ISFET sensor interface circuit", Palan B., Dos-Santos F.V., Karam J.M., Courtois B., Husak M., 1998 171-4 vol.1 Eurosensors-XII.-Proceedings-of-the-12th-European-Conference-on-Solid-State-Tranducers-and-the-9 "Bulk micromachining characterization of 0.2 mu m HEMT MMIC technology for GaAs MEMS design", Ribas R.P., Leclercq J.L., Karam J.M., Courtois B., Viktorovitch P., 1998 27 Feb. 1998; B51(1-3): 267-73 Elsevier Materials-Science-&-Engineering-B-Solid-State-Materials-for-Advanced-Technology. "Thermal transient testing of packages without a tester", Szekely V., Rencz M., Courtois B., 1998 236-9 IEEE, Piscataway, NJ, USA Proceedings-of-2nd-Electronics-Packaging-Technology-Conference-Cat.-No.98EX235 "Designing with 3D SOI CMOS", Abou-Samra S.J., Dudek V., Ayache F., Guyot A., Courtois B., Hoefflinger B., 1997 384-8 Electrochem. Soc, Pennington, NJ, USA Proceedings-of-the-Eighth-International-Symposium-on-Silicon-on-Insulator-Technology-and-Devices "Mechanical characterization of microgrippers realized by LIGA technique", Ballandras S., Basrour S., Robert L., Hauden D., 10.1109/SENSOR.1997.613722 1997 599-602 International Solid State Sensors and Actuators Conference (Transducers '97). IEEE International Solid State Sensors and Actuators Conference (Transducers '97). "A microcatalytic support realised by LIGA technique: the devil's comb", Basrour S., Mougin P., Pons M., Bernede P., Daniau W., Villermaux J., 10.1109/SENSOR.1997.613735 1997 649-52 Proceedings of International Solid State Sensors and Actuators Conference (Transducers '97). IEEE, New York, NY, USA Proceedings of International Solid State Sensors and Actuators Conference (Transducers '97). "Engineering tool set for monolithic and hybrid microsystem design", Boutamine H., Karam J.M., Courtois B., Drake P., Oudinot J., El-Tahawi H., Cao A., Poppe A., Rencz M., Szekely V., 1997 76-84 SPIE-Int. Soc. Opt. Eng Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering "Engineering tool set for monolithic and hybrid microsystem design", Boutamine H., Karam J.M., Courtois B., Drake P., Oudinot J., El-Tahawi H., Cao A., Rencz M., Poppe A., Szekely V., 10.1117/12.284556 1997 3225: 76-84 SPIE-Int. Soc. Opt. Eng Proceedings of SPIE -- Volume 3225 Microlithography and Metrology in Micromachining III "Generation of the HDL-A-Model of a Micromembrane from Its Finite-Element-Description", Hofmann K., Glesner M., Sebe N., Manolescu A., Marco S., Samitier J., Karam J.M., Courtois B., 10.1109/EDTC.1997.582341 1997 108 1997 European Design and Test Conference (ED&TC '97) "CAD and foundries for microsystems", Karam J.M., Courtois B., Boutamine H., Drake P., Poppe A., Szekely V., Rencz M., Hofmann K., Glesner M., 10.1145/266021.266317 1997 674 - 679 Annual ACM IEEE Design Automation Conference Proceedings of the 34th annual conference on Design automation "Synchrotron radiation for microstructure fabrication", Megtert S., Roulliay M., Liu Z.W., Kupka R., Labeque A., Casses V., Basrour S., Bernede P., 1997 745-8 AIP-Conference-Proceedings.Application of Accelerators in Research and Industry. Fourteenth International Conference AIP AIP-Conference-Proceedings.Application of Accelerators in Research and Industry. Fourteenth International Conference "GaAs MEMS design using 0.2 mu m HEMT MMIC technology", Ribas R.P., Bennouri N., Karam J.M., Courtois B., 1997 127-30 IEEE, New York, NY, USA GaAs-IC-Symposium.-IEEE-Gallium-Arsenide-Integrated-Circuit-Symposium.-19th-Annual-Technical-D "Thermal testing methods to increase system reliability", Szekely V., Rencz M., Courtois B., 1997 210-17 IEEE, New York, NY, USA Thirteenth-Annual-IEEE-Semiconductor-Thermal-Measurement-and-Management-Symposium-Cat.-N "Integrating on-chip temperature sensors into DfT schemes and BIST architectures", Szekely V., Rencz M., Courtois B., 10.1109/VTEST.1997.600330 1997 440-5 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings.-15th-IEEE-VLSI-Test-Symposium-Cat.-No.TB100125 "A step forward in the transient thermal characterization of packages", Szekely V., Rencz M., Courtois B., 1997 296-301 IMAPS - Int. Microelectron. & Packaging Soc, Reston, VA, USA Proceedings.-1997-International-Symposium-on-Microelectronics-SPIE-vol.3235 "CAD tools for thermal testing of electronic systems", Szekely V., Rencz M., Courtois B., 1997 2209-15 vol.2 ASME, New York, NY, USA Advances-in-Electronic-Packaging-1997.-Proceedings-of-the-Pacific-Rim/ASME-International-Intersoc "Automatic test generation for maximal diagnosis of linear analog circuits", Courtois B., Kolarik V., Lubaszewski M., Mir S., 10.1109/EDTC.1996.494157 1996 254-8 Proceedings.-European-Design-and-Test-Conference-ED&TC-96 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings.-European-Design-and-Test-Conference-ED&TC-96 "Some trends in CAD, test and fabrication of circuits and systems", Courtois B., 10.1109/ICEDTM.1994.496085 1996 1-8 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings.-Third-International-Conference-on-the-Economics-of-Design,-Test,-and-Manufacturing "Developments at CMP service: from microelectronics to microsystems", Courtois B., Karam J.M., Paret J.M., 1996 85-91 World Scientific, Singapore Proceedings-of-the-European-Workshop-Microelectronics-Education "CMP services: basic principles and developments", Courtois B., Delori H., Karam J.M., Paillotin J.F., Torki K., 1996 417-420 Shanghai Sci. & Technol. Literature Publishing House, Shanghai, China 2nd-International-Conference-on-ASIC-Proceedings-IEEE-Cat.-No.96TH8140. "Applied design and analysis of microsystems", Karam J.M., Courtois B., Poppe A., Hofmann K., Rencz M., Glesner M., Szekely V., 10.1109/EDTC.1996.494351 1996 528 1996 European Design and Test Conference (ED&TC '96) "High level CAD melds microsystems with foundries", Karam J.M., Courtois B., Bauge M., 10.1109/EDTC.1996.494338 1996 442-447 IEEE Comput. Soc. Press, Los Alamitos, CA, USA 1996 European Design and Test Conference (ED&TC '96) "From the MEMS idea to the MEMS product: CAD and foundries", Karam J.M., Courtois B., 10.1109/WESCON.1996.553966 1996 73-8 IEEE, New York, NY, USA Wescon/96-Conference-Proceedings "Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits", Mir S., Courtois B., Lubaszewski M., Kolarik V., 10.1109/EDTC.1996.494157 1996 254 1996 European Design and Test Conference (ED&TC '96) "Automatic test generation for maximal diagnosis of linear analog circuits", Mir S., Lubaszewski M., Kolarik V., Courtois B., 10.1109/EDTC.1996.494157 1996 254-258 IEEE Comput. Soc. Press, Los Alamitos, CA, USA 1996 European Design and Test Conference (ED&TC '96) "Built-in self-test approaches for analogue and mixed-signal integrated circuits", Mir S., Lubaszewski M., Liberali V., Courtois B., 1996 1145-50 vol.2 IEEE, New York, NY, USA 38th-Midwest-Symposium-on-Circuits-and-Systems.-Proceedings "Thermal Monitoring Of Safety-Critical Integrated Systems", Szekely V., Rencz M., Karam J.M., Lubaszewski M., Courtois B., 10.1109/ATS.1996.555172 1996 282 Fifth Asian Test Symposium (ATS'96) "Thermal monitoring of memories", Szekely 10.1109/MTDT.1996.782497 1996 86 IEEE International Technology, Design and Testing (MTDT '96) V., Courtois B., Workshop on Memory "Test structure for thermal monitoring", Szekely V., Kohari Z., Marta C., Rencz M., Courtois B., 10.1109/ICMTS.1996.535630 1996 111-115 IEEE, New York, NY, USA ICMTS-1996.-1996-IEEE-International-Conference-on-Microelectronic-Test-Structures-Proceedings "Thermal transient testing [IC packaging]", Szekely V., Rencz M., Courtois B., 1996 18-23 Microelectron. Soc, Reston, VA, USA 1996-International-Symposium-on-Microelectronics-SPIE-Vol.2920. "Microgrippers realized by LIGA techniques", Ballandras S., Daniau W., Basrour S., Robert D., Rocher S., Robert L., Blind P., Roulliay M., Bernede P., Megtert S., Liu Z.W., Labeque A., Rousseaux F., Ravet M.F., Hauden D., 10.1109/ETFA.1995.496667 1995 271-4 INRIA/IEEE Symposium on Emerging Technologies and Factory Automation. ETFA'95. 10-13 Oct. IEEE INRIA/IEEE Symposium on Emerging Technologies and Factory Automation. ETFA'95. 10-13 Oct. "Built-in self-test approaches for analogue and mixed-signal integrated circuits", Courtois B., Liberali V., Lubaszewski M., Mir S., 10.1109/MWSCAS.1995.510298 1995 1145-50 38th-Midwest-Symposium-on-Circuits-and-Systems.-Proceedings- IEEE, New York, NY, USA 38th-Midwest-Symposium-on-Circuits-and-Systems.-Proceedings"On-line and off-line testing: from digital to analog, from circuits to boards", Courtois B., Lubaszewski M., 1995 34-37 Editions Frontieres, Gif sur Yvette, France ESSCIRC-'95.-Twenty-First-European-Solid-State-Circuits-Conference.-Proceedings "Frequency-based BIST for analog circuit testing", Khaled S., Kaminska B., Courtois B., Lubaszewski M., 10.1109/VTEST.1995.512617 1995 54 - 59 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings-13th-IEEE-VLSI-Test-Symposium"Mixed-signal circuits and boards for high safety applications", Lubaszewski M., Kolarik V., Mir S., Nielsen C., Courtois B., 10.1109/EDTC.1995.470 1995 34 European Design and Test Conference (ED&TC '95) IEEE Computer Society European Design and Test Conference (ED&TC '95) "A general CAD concept and design framework architecture for integrated microsystems", Poppe A., Karam J.M., Hofmann K., Rencz M., Courtois B., Glesner M., Szekely V., 1995 259-66 Comput. Mech. Publications, Southampton, UK Simulation-and-Design-of-Microsystems-and-Microstructures "Built-in self-test and fault diagnosis of fully differential analogue circuits", Courtois B., Kolarik V., Lubaszewski M., Mir S., Nielsen C., 1994 486-90 Proceedings of 1994 IEEE International Conference on Computer Aided Design (CAD-94). 6-10 Nov. 1994 ACM, New York, NY, USA Proceedings of 1994 IEEE International Conference on Computer Aided Design (CAD-94). 6-10 Nov. 1994 "MPC services available worldwide", Courtois B., 10.1109/APCCAS.1994.514561 1994 266 275 IEEE, New York, NY, USA APCCAS-'94.-1994-IEEE-Asia-Pacific-Conference-on-Circuits-and-Systems "Designing self-exercising analogue checkers", Kolarik V., Lubaszewski M., Courtois B., 10.1109/VTEST.1994.292304 1994 252-7 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings-12th-IEEE-VLSI-Test-Symposium- "Built-in self-test and fault diagnosis of fully differential analogue circuits", Mir S., Kolarik V., Lubaszewski M., Nielsen C., Courtois B., 1994 486-90 ACM, New York, NY, USA 1994-IEEE/ACM-International-Conference-on-Computer-Aided-Design.-Digest-of-Technical-Papers-IE "Checking signatures on boundary scan boards", Castro-Alves V., Courtois B., Lubaszewski M., Nicolaidis M., 10.1109/ETC.1993.246573 1993 339-48 Proceedings-of-ETC-93.-Third-European-Test-Conference-Cat.-No.93TH0494-5 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings-of-ETC-93.-Third-European-Test-Conference-Cat.-No.93TH0494-5 "Towards self-checking mixed-signal integrated circuits", Kolarik V., Lubaszewski M., Courtois B., 1993 202-5 Editions Frontieres, Gif sur Yvette, France ESSCIRC-93.-Nineteenth-European-Solid-State-Circuits-Conference "Checking signatures on boundary scan boards", Lubaszewski M., Castro-Alves V., Nicolaidis M., Courtois B., 1993 339-48 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings-of-ETC-93.-Third-European-Test-Conference "Reliable fail-safe systems", Lubaszewski M., Courtois B., 1993 32-7 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings-of-the-Second-Asian-Test-Symposium- "Quiescent current monitoring to improve the reliability of electronic systems in space radiation environments", Vargas F., Nicolaidis M., Courtois B., 10.1109/ICCD.1993.393307 1993 596-600 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings-1993-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers-and-Proc "Testing embedded single and multi-port RAMs using BIST and boundary scan", Castro-Alves V., Lubaszewski M., Nicolaidis M., Courtois B., 10.1109/EDAC.1992.205914 1992 159-63 Proceedings.-The-European-Conference-on-Design-Automation-Cat.-No.92TH0414-3 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings.-The-European-Conference-on-Design-Automation-Cat.-No.92TH0414-3 "Testing embedded single and multi-port RAMs using BIST and boundary scan", Castro-Alves V., Lubaszewski M., Nicolaidis M., Courtois B., 10.1109/EDAC.1992.205914 1992 159-63 IEEE Comput. Soc. Press, Los Alamitos, CA, USA Proceedings.-The-European-Conference-on-Design-Automation "Generation of vector patterns through reseeding of multiple-polynomial linear feedback shift registers", Hellebrand S., Tarnick S., Rajski J., Courtois B., 1992 120-9 Int. Test Conference, Altoona, PA, USA Proceedings-International-Test-Conference-1992"On the design of self-checking boundary scannable boards", Lubaszewski M., Courtois B., 10.1109/54.386006 1992 372-81 Int. Test Conference, Altoona, PA, USA Proceedings-International-Test-Conference-1992 "Built-in self-test in multi-port RAMs", Castro-Alves V., Nicolaidis M., Lestrat P., Courtois B., 10.1109/ICCAD.1991.185244 1991 248-51 1991-IEEE-International-Conference-on-Computer-Aided-Design.-Digest-of-Technical-Papers-91CH30 IEEE Comput. Soc. Press, Los Alamitos, CA, USA 1991-IEEE-International-Conference-on-Computer-Aided-Design.-Digest-of-Technical-Papers-91CH30 "Built-in self-test in multi-port RAMs", Castro-Alves V., Nicolaidis M., Lestrat P., Courtois B., 1991 248-51 IEEE Comput. Soc. Press, Los Alamitos, CA, USA 1991-IEEE-International-Conference-on-Computer-Aided-Design.-Digest-of-Technical "Coupling electron-beam probing with knowledge-based fault localization", Marzouki M., Laurent J., Courtois B., 1991 238-47 Int. Test Conference, Altoona, PA, USA Proceedings.-International-Test-Conference-1991-IEEE "NAUTILE: a safe environment for silicon compilation", Bondono P., Jerraya A.A., Hornik A., Courtois B., Bonifas D., 1990 SESSION: Physical design optimization, Pages: 605 - 609 IEEE Computer Society Press Los Alamitos, CA, USA European Design Automation Conference Proceedings of the conference on European design automation "Description of a safe programming microprocessing unit for railway signalling", Chaumontet G., Nicolaidis M., Guyot A., Castro-Alves V., Courtois B., Gruere Y., Trousson D., 1990 509-13 CNET, Lannion, France 7th-International-Conference-on-Reliability-and-Maintainability.-Proceedings. "Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks", Darlay F., Courtois B., 1990 344-9 IEEE Comput. Soc. Press, Washington, DC, USA EDAC.-Proceedings-of-the-European-Design-Automation-Conference. "Study of hydrogen configurations by infrared spectroscopy, effusion and nuclear analysis in A-Si/sub x/Ge/sub y/H/sub z/ alloys", Basrour S., Bruyere J.C., Bustarret E., Godet C., Stoquert J.P., Sardin G., 1989 1010-12 Commission-of-the-European-Communities.-Ninth-E.C.-Photovoltaic-Solar-Energy-Conference.-Proce Kluwer Commission-of-the-European-Communities.-Ninth-E.C.-Photovoltaic-Solar-Energy-Conference.-Proce "A generalized theory of fail-safe systems", Courtois B., Nicolaidis M., Noraz S., 1989 398-406 FTCS-19-Digest-of-Papers.-The-Nineteenth-International-Symposium-on-Fault-Tolerant-Computing-C IEEE Comput. Soc. Press, Washington, DC, USA FTCS-19-Digest-of-Papers.-The-Nineteenth-International-Symposium-on-Fault-Tolerant-Computing-C "Test and design for testability of reconvergent fan-out CMOS logic networks", Darlay F., Courtois B., 10.1109/TEST.1989.82406 1989 956 IEEE Comput. Soc. Press, Washington, DC, USA International-Test-Conference-1989.-Proceedings.-Meeting-the-Tests-of-Time- "Architecture experimentation with the behavioural silicon compiler SYCO", Jerraya A.A., Courtois B., 10.1109/MELCON.1989.50041 1989 296-302 IEEE, New York, NY, USA MELECON-'89:-Mediterranean-Electrotechnical-Conference-Proceedings.-Integrating-Research,-Indu "Debugging integrated circuits: AI can help", Marzouki M., Courtois B., 10.1109/ETC.1989.36242 1989 184-91 Proceedings-of-the-1st-European-Test-Conference-IEEE-Cat.-No.89CH2696-3 IEEE Comput. Soc. Press, Washington, DC, USA Proceedings-of-the-1st-European-Test-Conference-IEEE-Cat.-No.89CH2696-3 "ADVICE project: final balance and future perspectives", Melgara M., Whyte I., Vernay Y.J., Boland F., Courtois B., 1989 89-99 Kluwer Academic Publishers, Dordrecht, Netherlands ESPRIT-'89.-Proceedings-of-the-6th-Annual-ESPRIT-Conference "A generalized theory of fail-safe systems", Nicolaidis M., Noraz S., Courtois B., 10.1109/FTCS.1989.105602 1989 398-406 FTCS-19-Digest-of-Papers.-The-Nineteenth-International-Symposium-on-Fault-Tolerant-Computing-C 1989: IEEE Comput. Soc. Press, Washington, DC, USA FTCS-19-Digest-of-Papers.-The-Nineteenth-International-Symposium-on-Fault-Tolerant-Computing-C 1989: "VLSI implementation for control of critical systems", Noraz S., Nicolaidis M., Courtois B., 1989 53-8 Safety-of-Computer-Control-Systems-1989-SAFECOMP'89-Proceedings-of-the-IFAC/IFIP-Workshop. Pergamon, Oxford, UK Safety-of-Computer-Control-Systems-1989-SAFECOMP'89-Proceedings-of-the-IFAC/IFIP-Workshop. "VLSI implementation for control of critical systems", Noraz S., Nicolaidis M., Courtois B., 1989 53-8 Pergamon, Oxford, UK Safety-of-Computer-Control-Systems-1989-SAFECOMP'89-Proceedings-of-the-IFAC/IFIP-Workshop. "Fault simulation and test pattern generation at the multiple-valued switch level", Caisso J.-P., Courtois B., 10.1109/TEST.1988.207785 1988 94-101 International-Test-Conference-1988-Proceedings-New-Frontiers-in-Testing-Cat.-No.88CH2610-4 IEEE Comput. Soc. Press, Washington, DC, USA International-Test-Conference-1988-Proceedings-New-Frontiers-in-Testing-Cat.-No.88CH2610-4 "Gap state studies in a-Si/sub 1-x/Ge/sub x/:H alloys", Chahad L., Theye M.L., Basrour S., Bruyere J.C., Godet C., Lloret A., 1988 846-50 Eighth-E.C.-Photovoltaic-Solar-Energy-Conference.-Proceedings-of-the-International-Conference-EUR Kluwer Eighth-E.C.-Photovoltaic-Solar-Energy-Conference.-Proceedings-of-the-International-Conference-EUR "Testing integrated circuits from an ergonomic point of view: the expert system PESTICIDE", Marzouki M., Laurent J., Courtois B., 1988 317-27 ERGO-IA-'88.-Colloque-Europeen-Ergonomie-et-Intelligence-Artificielle.-Actes-ERGO-IA-'88.-Europea AFCET, Paris, France ERGO-IA-'88.-Colloque-Europeen-Ergonomie-et-Intelligence-Artificielle.-Actes-ERGO-IA-'88.-Europea "UBIST version of the SYCO's control section compiler", Torki K., Nicolaidis M., Jerraya A.A., Courtois B., 10.1109/ICCD.1988.25730 1988 392-6 Proceedings-of-the-1988-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers-an IEEE Comput. Soc. Press, Washington, DC, USA Proceedings-of-the-1988-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers-an "A history of research in fault tolerant computing at the Grenoble University", David R., Courtois B., Saucier G., 1987 337-53 Evolution-of-Fault-Tolerant-Computing.-In-the-Honor-of-William-C.-Carter Springer-Verlag, Vienna, Austria Evolution-of-Fault-Tolerant-Computing.-In-the-Honor-of-William-C.-Carter "The SYCO silicon compiler and its environment", Jerraya A.A., Courtois B., 1987 499-526 Design-Systems-for-VLSI-Circuits.-Logic-Synthesis-and-Silicon-Compilation.-Proceedings-of-the-NAT Martinus Nijhoff, Dordrecht, Netherlands Design-Systems-for-VLSI-Circuits.-Logic-Synthesis-and-Silicon-Compilation.-Proceedings-of-the-NAT "Design of a self-checking microprocessor for real-time applications", Osseiran A., Bied-Charreton D., Nicolaidis M., Schoellkopf J.-P., Courtois B., Le Trung B., 1987 337-43 Control-in-Transportation-Systems-1986.-Proceedings-of-the-5th-IFAC/IFIP/IFORS-Conference Pergamon, Oxford, UK Control-in-Transportation-Systems-1986.-Proceedings-of-the-5th-IFAC/IFIP/IFORS-Conference "Advances in fault modelling and test pattern generation for CMOS", Baschiera D., Courtois B., 1986 82-5 Proceedings-of-the-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers.-ICCD-'8 IEEE Comput. Soc. Press, Washington, DC, USA Proceedings-of-the-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers.-ICCD-'8 "Towards automatic failure analysis of complex ICs through e-beam testing", Bergher L., Laurent J., Courtois B., Collin J., 1986 465-71 International-Test-Conference-1986-Proceedings.-Testing's-Impact-on-Design-and-Technology-Cat.-N IEEE Comput. Soc. Press, Washington, DC, USA International-Test-Conference-1986-Proceedings.-Testing's-Impact-on-Design-and-Technology-Cat.-N "Self-checking circuits: from theory to practice", Courtois B., Nicolaidis M., 1986 83-8 Safety-of-Computer-Control-Systems-1986-SAFECOMP-'86.-Trends-in-Safe-Real-Time-Computer-Sy Pergamon, Oxford, UK Safety-of-Computer-Control-Systems-1986-SAFECOMP-'86.-Trends-in-Safe-Real-Time-Computer-Sy "Random testing versus deterministic testing of RAMs", Fuentes A., David R., Courtois B., 1986 266-71 FTCS-Digest-of-Papers.-16th-Annual-International-Symposium-on-Fault-Tolerant-Computing-Systems IEEE Comput. Soc. Press, Washington, DC, USA FTCS-Digest-of-Papers.-16th-Annual-International-Symposium-on-Fault-Tolerant-Computing-Systems "Electron beam observability and controllability for the debugging of integrated circuits", Guiguet I., Micollet D., Laurent J., Courtois B., 1986 181-3 ESSCIRC-'86.-Twelfth-European-Solid-State-Circuits-Conference Delft Univ. Technol, Delft, Netherlands ESSCIRC-'86.-Twelfth-European-Solid-State-Circuits-Conference "Principles of the SYCO compiler", Jerraya A.A., Varinot P., Jamier R., Courtois B., 10.1145/318013.318148 1986 715 - 721 ACM IEEE Annual ACM IEEE Design Automation Conference "Self-checking circuits: from theory to practice", Nicolaidis M., Courtois B., 1986 83-8 Safety-of-Computer-Control-Systems-1986-SAFECOMP-'86.-Trends-in-Safe-Real-Time-Computer-Sy Pergamon, Oxford, UK Safety-of-Computer-Control-Systems-1986-SAFECOMP-'86.-Trends-in-Safe-Real-Time-Computer-Sy "Design of NMOS strongly fault secure circuits using unidirectional errors detecting codes", Nicolaidis M., Courtois B., 1986 22-7 FTCS-Digest-of-Papers.-16th-Annual-International-Symposium-on-Fault-Tolerant-Computing-Systems IEEE Comput. Soc. Press, Washington, DC, USA FTCS-Digest-of-Papers.-16th-Annual-International-Symposium-on-Fault-Tolerant-Computing-Systems "Are VLSI circuits testable?", Courtois B., 1985 vol.B ; 20-5 Data-Processing:-Opportunities-and-Drawbacks.-Proceedings-of-Convention-Informatique Convention Inf, Paris, France Data-Processing:-Opportunities-and-Drawbacks.-Proceedings-of-Convention-Informatique "Strongly language disjoint checkers", Jansch I., Courtois B., 1985 390-5 Fifteenth-Annual-International-Symposium-on-Fault-Tolerant-Computing-FTCS-15.-Digest-of-Papers.IEEE Comput. Soc. Press, Silver Spring, MD, USA Fifteenth-Annual-International-Symposium-on-Fault-Tolerant-Computing-FTCS-15.-Digest-of-Papers."Microarchitecture of the MC68000 and evaluation of a self checking version", Marchal P., Nicolaidis M., Courtois B., 1985 225-86 Microarchitecture-of-VLSI-Computers.-Proceedings-of-the-NATO-Advanced-Study-Institute Martinus Nijhoff, Dordrecht, Netherlands Microarchitecture-of-VLSI-Computers.-Proceedings-of-the-NATO-Advanced-Study-Institute "Methodology for the use of an electron-beam tester of integrated circuits", Courtois B., 1984 vol.1 ; 217-20 1984-IEEE-International-Symposium-on-Circuits-and-Systems.-Proceedings-Cat.-No.-84CH1993-5. IEEE, New York, NY, USA 1984-IEEE-International-Symposium-on-Circuits-and-Systems.-Proceedings-Cat.-No.-84CH1993-5. "Design of self-checking N-MOS (H-MOS) integrated circuits", Courtois B., Nicolaidis M., 1984 13/1-20 AGARD-Conference-Proceedings-No.-361.-Design-for-Tactical-Avionics-Maintainability-AGARD-CP-3 Oct. AGARD, Neuilly sur Seine, France AGARD-Conference-Proceedings-No.-361.-Design-for-Tactical-Avionics-Maintainability-AGARD-CP-3 Oct. "Test pattern generation with respect to fault modelling", Courtois B., 1984 199-203 Advances-in-Microprocessing-and-Microprogramming.-Tenth-EUROMICRO-Symposium-on-Microproc Myhrhaug,-B.; Wilson,-D.-R. Advances-in-Microprocessing-and-Microprogramming.-Tenth-EUROMICRO-Symposium-on-Microproc "Advances in test pattern generation for integrated circuits", Courtois B., 1984 3/28-44 Proceedings-of-Automatic-Testing-and-Test-Instrumentation-'84 Network Events, Buckingham, UK Proceedings-of-Automatic-Testing-and-Test-Instrumentation-'84 "Design of SCD checkers based on analytical fault hypotheses", Jansch I., Courtois B., 1984 109-12 ESSCIRC-'84.-Tenth-European-Solid-State-Circuits-Conference CEP Consultants, Edinburgh, UK ESSCIRC-'84.-Tenth-European-Solid-State-Circuits-Conference "Design of self-checking N-MOS (H-MOS) integrated circuits", Nicolaidis M., Courtois B., 1984 13/1-20 AGARD-Conference-Proceedings-No.-361.-Design-for-Tactical-Avionics-Maintainability-AGARD-CP-3 AGARD, Neuilly sur Seine, France AGARD-Conference-Proceedings-No.-361.-Design-for-Tactical-Avionics-Maintainability-AGARD-CP-3 "Strongly code disjoint checkers", Nicolaidis M., Jansch I., Courtois B., 1984 16-21 Fourteenth-International-Conference-on-Fault-Tolerant-Computing.-Digest-of-Papers-Cat.-No.-84CH2 IEEE Comput. Soc. Press, Silver Spring, MD, USA Fourteenth-International-Conference-on-Fault-Tolerant-Computing.-Digest-of-Papers-Cat.-No.-84CH2 "Functional testing vs. structural testing of RAMS", Sahami H., Courtois B., 1984 391-403 Fault-Tolerant-Computing-Systems.-2nd-GI/NTG/GMR-Conference. Springer-Verlag, Berlin, West Germany Fault-Tolerant-Computing-Systems.-2nd-GI/NTG/GMR-Conference. "Testing for failure analysis: new tools and new test methods", Baille G., Bergher L., Courtois B., Laurent J., Rubat-Du-Merac C., 1983 266-9 FTCS-13th-Annual-International-Symposium.-Fault-Tolerant-Computing.-Digest-of-Papers IEEE, New York, NY, USA FTCS-13th-Annual-International-Symposium.-Fault-Tolerant-Computing.-Digest-of-Papers "Error confinement/data recovery in distributed systems", Ben-Romdhane M., Courtois B., 1982 11-18 Proceedings-of-the-Second-Symposium-on-Reliability-in-Distributed-Software-and-Database-Systems IEEE, New York, NY, USA Proceedings-of-the-Second-Symposium-on-Reliability-in-Distributed-Software-and-Database-Systems "Performance modeling of partially self-checking systems", Courtois B., 1982 140-46 FTCS-12th-Annual-International-Symposium-on-Fault-Tolerant-Computing.-Digest-of-Papers IEEE, New York, NY, USA FTCS-12th-Annual-International-Symposium-on-Fault-Tolerant-Computing.-Digest-of-Papers "On detecting the hardware failures disrupting programs in microprocessors", Marchal P., Courtois B., 1982 249-56 FTCS-12th-Annual-International-Symposium-on-Fault-Tolerant-Computing.-Digest-of-Papers IEEE, New York, NY, USA FTCS-12th-Annual-International-Symposium-on-Fault-Tolerant-Computing.-Digest-of-Papers "A methodology for on-line testing of microprocessors", Courtois B., 1981 272-4 FTCS-11.-The-Eleventh-Annual-International-Symposium-on-Fault-Tolerant-Computing. 1981: IEEE, New York, NY, USA FTCS-11.-The-Eleventh-Annual-International-Symposium-on-Fault-Tolerant-Computing. 1981: "Analytical testing of data processing sections of integrated CPUs", Courtois B., 1981 21-8 1981-International-Test-Conference.-Testing-in-the-1980's IEEE, New York, NY, USA 1981-International-Test-Conference.-Testing-in-the-1980's "Failure mechanisms, fault hypotheses and analytical testing of LSI-NMOS (HMOS) circuits", Courtois B., 1981 341-50 VLSI-81.-Very-Large-Scale-Integration.-Proceedings-of-the-First-International-Conference-on-Very-La Academic Press, London, UK VLSI-81.-Very-Large-Scale-Integration.-Proceedings-of-the-First-International-Conference-on-Very-La "A light efficient and microprocessor-oriented ATE", Courtois B., Postigo C., Geay F., Girard J.-M., Meinguss A., 1981 7/42-53 vol.7 Automatic-Testing-81-&-Test-Instrumentation Network, Buckingham, UK Automatic-Testing-81-&-Test-Instrumentation "On-line oriented functional testing of control sections of integrated CPUs", Courtois B., 1981 221-31 Implementing-Functions:-Microprocessors-and-Firmware.-Seventh-EUROMICRO-Symposium-on-Micr North-Holland, Amsterdam, Netherlands Implementing-Functions:-Microprocessors-and-Firmware.-Seventh-EUROMICRO-Symposium-on-Micr "Optimal frequencies for concurrent and periodical tests of logical systems", Courtois B., 1980 460-6 Second-International-Conference-on-Reliability-and-Maintainability Centre de Fiabilite CNET, Lannion, France Second-International-Conference-on-Reliability-and-Maintainability "Project of an architecture for the command of an electronic switching system", Anceau F., Courtois B., Marinescu M., Olaiwan A., Pons J.-F., Lecerf C., 1979 608-14 International-Switching-Symposium. 1979: Colloque International de la Communication, Paris, France International-Switching-Symposium. 1979: "Some results about the efficiency of simple mechanisms for the detection of microcomputer malfunctions", Courtois B., 1979 71-4 Ninth-Annual-International-Symposium-on-Fault-Tolerant-Computing. 1979: IEEE, New York, NY, USA Ninth-Annual-International-Symposium-on-Fault-Tolerant-Computing. 1979: "On balancing safety and reliability of hybrid and `Bi-duplexed' systems", Courtois B., 1976 52-7 1976-International-Symposium-on-Fault-Tolerant-Computing IEEE, New York, NY, USA 1976-International-Symposium-on-Fault-Tolerant-Computing "Microprogramming as a means of evaluation of a computer's performance and reliability", Courtois B., Saucier G., 1975 53-61 Workshop-on-the-Microarchitecture-of-Computer-Systems North-Holland, Amsterdam, Netherlands Workshop-on-the-Microarchitecture-of-Computer-Systems Communications à des congrès, symposium "Wireless sensor network node with asynchronous architecture and vibration harvesting micro power generator", Ammar Y., A. B., Marzencki M., Charlot B., Basrour S., Matou K., Renaudin M., 2005 287-292 The Smart Objects and Ambient Intelligence Conference (SoC-EUSAI'05), October 12-14 Imatec Diffusion "Design and fabrication of a new system for vibration energy harvesting", Despesse G., Jager T., Chaillout J.J., Leger J.M., Basrour S., 10.1109/RME.2005.1543034 2005 225 - 228 vol.1 Research in Microelectronics and Electronics, 2005 PhD IEEE "Piezoelectric micro-machined ultrasonic transducer (pMUT) for energy harvesting", Dogheche K., Cavallier B., Delobelle P., Hirsinger L., Ballandras S., Cattan E., Rémiens D., Marzencki M., Charlot B., Basrour S., 2005 939 - 942 Ultrasonics Symposium, 18-21 Sept. IEEE "A MEMS piezoelectric vibration energy harvesting device", Marzencki M., Basrour S., Charlot B., Spirkovich S., Colin M., 2005 45 # 48 Fifth Int. Workshop on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS'05), , November 28-30 MSI "Thermo-Mechanical Characterization and Integrity Checking of Packages and Movable-Structures", Szabo P., G. P., G.Y. B., G.Y. H., Ress S., Poppe A., Szekely V., Rencz M., Courtois B., 2005 331 - 334 : Vol.3 Technical Proceedings of the 2005 Nanotechnology Conference and Trade Show, Volume 3 NSTI "CMP: the access to advanced low cost manufacturing", Torki K., Courtois B., 2001 6 Proceedings 2001 International Conference on Microelectronic Systems Education. MSE'01. Designing Microsystems in the New Millennium, 17-18 June6 IEEE Séminaires, workshops "Thermal modelling of multiple die packages", Szabo P., Rencz M., Szekely V., Poppe A., Farkas G., Courtois B., 10.1109/EPTC.2005.1614459 2005 Volume: 2, On page(s): 5 pp.- Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th IEEE Chapitres dans les ouvrages "Dépôts en phase liquide : application aux microtechniques", Basrour S., 2004 91-120 Hermès Techniques de fabrication des microsystèmes 1 : structures et microsystèmes électromécaniques en couches minces "From Microelectronics to Integrated Microsystems Testing", Mir S., Charlot B., 2003 241-263 Hermes Penton Science Microsystems Technology # Fabrication, test and reliability "Microbobines pour MAGMAS", Basrour S., 2002 Vol.1 Hermès Micro-actionneurs électromagnétiques MAGMAS "Les technologies de fabrication des microsystèmes", Charlot B., 2002 chapitre 3: 69-100 Hermès Science, 220 p. Conception de microsystèmes sur silicium "Les domaines d'application des microsystèmes", Charlot B., 2002 39-68 : chapitre 2 Hermès Science Conception de microsystèmes sur silicium (Traité EGEM, série Electronique et micro-électronique) "La CAO des microsystèmes", Charlot B., Martinez S., Mir S., 2002 129-176 : chapitre 5 Hermès Science, 220 p. Conception de microsystèmes sur silicium "Perspectives des microsystèmes sur silicium", Mir S., Charlot B., 2002 199-214 : chapitre 6 Hermès Science, 218 p. Dispositifs et physique des microsystèmes sur silicium "Les microsystèmes thermiques", Mir S., Charlot B., Parrain F., 2002 chapitre 2: 65-104 Hermès Science, 218p. Dispositifs et physique des microsystèmes sur silicium (Traité EGEM, série Electronique et micro-électronique) "Micro-accéléromètre intégré 3 axes", Jeannot J.C., Schropfer G., Goy J., Courtois B., De Labachelerie M., 2000 Vol. 1 N°1 Hermès Science Microcapteurs et microsystèmes intégrés (NMT, Nano et Micro Technologies) "Models for the control of the test and of the reconfiguration of a computer", Courtois B., 1979 vol.V. : 410-8 Wiley, Chichester, UK Progress-in-cybernetics-and-systems-research, Livres et ouvrages "Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2004), 12-14 May 2004, Montreux, Switzerland: Special Issue, Analog Integrated Circuits and Signal Processing", Courtois B., 2005 Volume 44, Number 2, 107-183 Springer Science+Business Media B.V., Formerly Kluwer Academic Publishers B.V. "Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2005), Montreux,Switzerland, June 1-3, 2005", Courtois B., Markus K., 2005 422 pages TIMA Laboratory "Proceedings on 11th International Workshop on THERMAL INVESTIGATIONS of ICs and Systems (THERMINIC 2005), 27 - 30 September 2005, Belgirate, Lake Maggiore, Italy", Courtois B., Lasance C., Rencz M., Szekely V., 2005 305 pages TIMA EDITIONS, 46 avenue Félix Viallet, 38031 Grenoble Cedex "Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2003), 5-7 May 2003, Mandelieu-La Napoule, "Côte d'Azur", France: Special issue, Microsystem Technologies", Courtois B., Michel B., 10.1007/s00542-004-0419-y 2004 Volume 10, Number 5, 345-437 Springer-Verlag GmbH "Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2003), 5-7 May 2003 - Mandelieu-La Napoule, "Côte d'Azur", France: Special issue, Analog Integrated Circuits and Signal Processing", Courtois B., Korvink J., 2004 Volume 40, Number 2, 185 pages Publisher: Springer Science+Business Media B.V., Formerly Kluwer Academic Publishers B.V. "Proceedings on Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP'04), Montreux, Switzerland, May 12-14, 2004", Courtois B., Markus K., 2004 487 pages TIMA Laboratory "Proceedings on 10th International Workshop on THERMAL INVESTIGATIONS of ICs and Systems (THERMINIC 2004), 29 September - 1 October 2004, Sophia Antipolis, Côte d'Azur, France", Courtois B., Lasance C., Rencz M., Szekely V., 2004 335 pages TIMA Laboratory "Proceedings on Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'03), Cannes, France, May 5-7, 2003", Courtois B., Markus K., 2003 412 pages TIMA Laboratory "Proceedings on 9th International Workshop on THERMAL INVESTIGATIONS of ICs and Systems (THERMINIC 2003), 24-26 September 2003, Aix-en-Provence, France", Courtois B., Lasance C., Rencz M., Szekely V., 2003 341 pages TIMA Laboratory "Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2001), 25-27 April 2001-Cannes-Mandelieu, "Côte d'Azur", France: Special Issue, Analog Integrated Circuits and Signal Processing", Courtois B., 2002 Volume 32, Number 1, 101 pages Publisher: Springer Science+Business Media B.V., Formerly Kluwer Academic Publishers B.V. "Proceedings on Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP'02), Cannes-Mandelieu, France, May 5-8, 2002", Courtois B., Markus K., 2002 830 pages TIMA Laboratory "Proceedings on 8th International Workshop on THERMal INvestigations of ICs and Systems (THERMINIC 2002), 1-4 October 2002, Madrid, Spain", Courtois B., Lasance C., Rencz M., Szekely V., 2002 321 pages TIMA Laboratory "Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2000), Paris, France, 9-11 May 2000: Special Issue, Analog Integrated Circuits and Signal Processing", Courtois B., 2001 Volume 29, Numbers 1-2, 158 pages Springer Science+Business Media B.V., Formerly Kluwer Academic Publishers B.V. "Proceedings on Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'2001), Cannes - Mandelieu, France, April 25-27, 2001", Courtois B., Markus K., 2001 556 pages TIMA Laboratory "Proceedings on 7th International Workshop on THERMal INvestigations of ICs and Systems (THERMINIC 2001), September 24-27, 2001, Paris, France", Courtois B., Lasance C., Rencz M., Szekely V., 2001 299 pages TIMA Laboratory "Proceedings on Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP of MEMS/MOEMS ), Paris, France, 9-11 May 2000", Courtois B., Markus K., 2000 594 pages TIMA Laboratory "Proceedings on 6th International Workshop on THERMal INvestigations of ICs and Systems (THERMINIC 2000), September 24-27, 2000, Budapest, Hungary", Courtois B., Rencz M., Szekely V., Lasance C., Poppe A., 2000 275 pages TIMA Laboratory "5th International Workshop on THERMAL INVESTIGATIONS of ICs and MICROSTRUCTURES (THERMINIC 1999), October 3-6, 1999, ROME, Italy: Special Issue, Microelectronics Journal", Rencz M., Courtois B., Lasance C., Szekely V., 2000 Volume 31, Issues 9-10, 725-824 Elsevier "Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2005), Paris,France, 30 March-1st April 1999", Courtois B., Markus K., 1999 1189 pages TIMA Laboratory "Proceedings on 5th International Workshop on THERMAL INVESTIGATIONS of ICs and MICROSTRUCTURES (THERMINIC 1999) October 3-6, 1999,ROME, Italy", Courtois B., Rencz M., Szekely V., Lasance C., 1999 370 pages Tima Laboratory "4th International Workshop on THERMAL INVESTIGATIONS of ICs and MICROSTRUCTURES (THERMINIC 1998) September 27-29,Cannes, "Côte d'Azur", France: Special Issue, Microelectronics Journal", Rencz M., Szekely V., Courtois B., 1999 Volume 30, Issue 11 , November, 1083-1172 Elsevier "3rd International Workshop on THERMAL INVESTIGATIONS of ICs and MICROSTRUCTURES (THERMINIC 1997), September 21-23, Cannes, "Côte d'Azur", France: , Volume", Courtois B., Szekely V., Rencz M., 1998 Issues 1-2 , November, 157 p. Elsevier "3rd International Workshop on THERMAL INVESTIGATIONS of ICs and MICROSTRUCTURES (THERMINIC 1997), September 21-23, Cannes, "Côte d'Azur", France: Special Issue, Microelectronics Journal", Szekely V., Rencz M., Courtois B., 1998 Issues 4-5, April-May, 159-297 Elsevier "2nd International Workshop onTHERMAL INVESTIGATIONS of ICs and MICROSTRUCTURES (THERMINIC 1996), September 25-27,Budapest Hungary: Special Issue, IEEE Transactions on VLSI Systems", Szekely V., Courtois B., Rencz M., 1997 Vol. 5, N° 3, Sept., 250-343 IEEE "International Workshop on Thermal Investigations of ICs and Microstructures (THERMINIC 1996) September 25-27, 1996, Budapest, Hungary: Special Issue of Microelectronics Journal", Szekely V., Rencz M., Courtois B., 1997 Volume 28, Issue 3 , March, 205-365 Elsevier "International Workshop on Thermal Investigations of ICs and Microstructures (THERMINIC 1995) September 25-26, 1995, Grenoble, France: Special Issue, Sensors and Actuators A: Physical", Szekely V., Rencz M., Courtois B., 1996 Issue 1 , 15 July, 1-70 Elsevier Brevets "Test device for a combinatorial logic circuit and integrated circuit including such a device", Courtois B., Baschiera D., EP0229433 1988-12-06 Thèses "Modélisation de fautes et microsystèmes", Charlot B., conception en vue du test structurel des "Test et LSI", Courtois B., "Etude d'un calculateur tolérant des pannes, ses fiabilité, sécurité, performance et coût", Courtois B., Autres "Micro-convertisseur d'énergie mécano-électrique", Hirsinger L., S. B., Basrour S., Emmanuel F., Bethillier M., De Labachelerie M., Marzencki M., 2004