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Basic questions related to electron-induced sputtering
Egerton, Ray; Wang, Feng; McLeod, Robert; Malac, Marek
For the publisher’s version, please access the DOI link below./ Pour consulter la version de l’éditeur, utilisez le lien
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http://dx.doi.org/10.1017/S1431927609092204
Microscopy and Microanalysis, 15, S2, pp. 1356-1357, 2009-07-26
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Microscopy and Microanalysis
Volume 15, Issue SUPPL. 2, July 2009, Pages 1356-1357
Basic questions related to electroninduced sputtering
Egerton, R.a,Wang, F.b,McLeod, R.a,Malac, M.b
a
b
Department of Physics, University of Alberta, Edmonton, T6G 2G7, Canada
National Institute of Nanotechnology, Edmonton, AB T6G 2M9, Canada
View references (5)
Abstract
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ISSN: 14319276 CODEN: MIMIFSource Type: Journal Original language: English
DOI: 10.1017/S1431927609092204Document Type: Article
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1
Cherns, D.
Sputtering in the high-voltage electron microscope
(1979) Surface Science, 90 (2), pp. 339-356. Cited 10 times.
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2
Braidy, N., Jakubek, Z.J., Simard, B., Botton, G.A.
Quantitative energy dispersive X-ray microanalysis of electron beam-sensitive alloyed
nanoparticles
(2008) Microscopy and Microanalysis, 14 (2), pp. 166-175. Cited 3 times.
doi: 10.1017/S1431927608080094
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3
Egerton, R.F., Wang, F., Crozier, P.A.
Beam-induced damage to thin specimens in an intense electron probe
(2006) Microscopy and Microanalysis, 12 (1), pp. 65-71. Cited 35 times.
doi: 10.1017/S1431927606060065
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4
Zobelli, A., Gloter, A., Ewels, C.P., Seifert, G., Colliex, C.
Electron knock-on cross section of carbon and boron nitride nanotubes
(2007) Physical Review B - Condensed Matter and Materials Physics, 75 (24), art. no.
245402. Cited 61 times.
http://oai.aps.org/oai?verb=GetRecord&Identifier
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doi: 10.1103/PhysRevB.75.245402
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5
We are grateful to NSERC for financial support of this research
Egerton, R.; Department of Physics, University of Alberta, Edmonton, T6G 2G7,
Canada
© Copyright 2009 Elsevier B.V., All rights reserved.
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