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Curriculum vitae
Personal information
Name/Surname Ligor Octavian
Address 144 Iuliu Maniu Avenue, Bl. 34, Sc. A, Et. 4, Ap. 20, code 061116, Bucharest 6
Phone no. +4.0733243578
E-mail [email protected]
Nationality Romanian
Birth Date August 24th 1976
Sex Male
Work place National Institute for Research and Development in Microtechnologies (IMT-Bucharest)
Occupation Senior Scientific researcher III
Professional Experience
Period 2002 – 2006
Position Assistant Researcher
Main Activities Atomic Force Microscopy
Employer name National Institute for Research and Development in Microtechnologies (IMT-Bucharest)
Activity Scientific research
Period 2006 - 2010
Position PhD student
Main Activities Dopant concentration characterization by electric AFM
Employer name National Institute of Applied Science - INSA Lyon
Activity Scientific research
Period 2010
Position Postdoctoral fellow
Main Activities Thin films fabrication and characterization
Employer name National Institute of Applied Science - INSA Lyon
Activity Scientific research
Period 2011 - present
Position scientific researcher III
Main Activities Dip-Pen Nanolithography, AFM
Employer name National Institute for Research and Development in Microtechnologies – (IMT-Bucharest)
Activity Scientific research
Education
Period 1997 - 2001
Qualification/ Diploma Atomic Physics/Bachelors Degree
Studied disciplines Atomic Physics, Molecular Physics
Institution Name University of Bucharest, Faculty of Physics
Period 2002 - 2004
Qualification/ Diploma Atomic Physics/Master degree
Studied disciplines Atomic Physics, Molecular Physics
Institution Name University of Bucharest, Faculty of Physics
Period 2006-2010
Qualification/ Diploma Nanotechnology/PhD diploma
Institution Name National Institute of Applied Sciences of Lyon, France
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Period 2013-present
Qualification/ Diploma PhD Student
Institution Name Applied Chemistry and Material Sciences
Personal Aptitudes
and competencies
Mother tongue Romanian
Known foreign English, French
languages
Additional information
Relevant scientific activity
Participation in funded research projects (selection)
Name of the project and time scale
2011 - 2013 : Fabrication and characterization of micro and nano metallic
structures by Dip-Pen Nanolithography - PN-II-RU-PD-2011-3-0216
2006 – 2010 : Développement de métrologies 2D et 3D pour la cartographie
des dopants dans les nanostructures de semiconducteurs – Cartodop
2007 – 2009 : Pullnano - Pulling the limits of nanoCMOS Electronics
2001 – 2004 : Characterization of materials and structures for micro and
nanoengineering research laboratories network MINAMAT-NET
2001 – 2004 : Technologies for the fabrication of Fabry-Perot microinterferometers integrated on silicon OPTICMEMS
2003 – 2005 : Integrated photonic microstructures for chemical and biological
analysis FOTOSENZ
2004 – 2005 : Microtechnologies for multifunctional cantilevers integrated on
silicon for the fabrication of microsensors and microactuators
Abbreviations: MRT - member of the research team, PL - project leader
Funding organization
Romanian Ministry of Education and Research
Role
PL
French National Research Agency program ANR
MRT
EU FP6
Romanian Ministry of Education and Research
MRT
MRT
Romanian Ministry of Education and Research
MRT
Romanian Ministry of Education and Research
MRT
Romanian Ministry of Education and Research
MRT
List of publications
1. B. Gautier, A. Brugere, O. Ligor, S. Gidon, D. Albertini, A. Descamps-Mandine, “Mesure et cartographie à l'échelle nanométrique des
propriétés ferroélectriques et diéectriques des couches minces par les techniques dérivées de la microscopie à force atomique”, Matériaux et
Techniques 2011
2. O. Ligor, B. Gautier, A. Descamps-Mandine, D. Albertini, N. Baboux, L. Militaru, “Interpretation of scanning capacitance microscopy for thin
oxides characterization”, Thin Solid Films, vol.517, no.24, October 2009
International conferences with proceedings
1. Andreea Oprisa, Raluca Gavrila, Andrei Avram, Mihai Danila, Adrian Dinescu, O. Ligor, and Victor Leca, "Physical and chemical methods for
composition and surface morphology control of NdGaO3 (001) and (110), and KTaO3 (001) substrates", E-MRS 2013 Spring Meeting,
symposium N
2. O. Ligor, W. Hurani, L. Militaru, B. Gautier, “Metrology aspects with electrical AFM. Comparative analysis between Scanning Capacitance
Microscope and Impedance Analyzer”, E-MRS, Warsaw, September 2010
3. O. Ligor, B. Gautier, S.Pelloquin, A. Sabac, J. Gregoire, D. Albertini, A. Descamps-Mandine “Charging effects during characterization of
ultrathin oxides by Scanning Capacitance Microscopy”, E-MRS, Strasbourg, June 2009
4. O. Ligor, A. Descamps, D. Albertini, L. Militaru, N. Baboux and B. Gautier, “Nanoscale Characterization Of Ultra-Thin Dielectrics Using
Scanning Capacitance Microscopy”, International Conference on Frontiers of Characterization and Metrology for Nanoelectronics ICF-CMN,
Albany, Mai 2009
5. R. Muller, D. Esinenco, M. Kusko, P. Obreja, E. Manea, O. Ligor , D. Apostol, V. Damian, M. Mateescu, L. Moldovan, L. Tcacenco, S. D.
Psoma, A. Schneider, E. Huq, “Integrated polymeric Mach Zehnder interferometer for biosensing applications”, Proceedings of the International
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Semiconductor Conference, “CAS 2005”, Sinaia, Romania, October 2005
6. V.Damian, P.C.Logofatu, D.Apostol, F.Garoi, I.Iordache, A.Timcu, O.Ligor , R.Muller, “Polimer thin film refractive index determination”,
Proceedings of the International Semiconductor Conference, “CAS 2004”, Sinaia, Romania, October 2004
7. M.Bercu, C.Moldovan, R.Gavrila, B.N.Bercu, O.Ligor , "Investigations on phosphosilicate glass by using IR, AFM and Cluster Model
Calculation", Proceedings of the International Semiconductor Conference, “CAS 2002”, Sinaia, Romania, October 2002 International
Conferences without procedings
7. B. Gautier, O. Ligor, D. Albertini, A. Descamps, D. Goghero, G. Bremond, C, Plossu, M. Hocevar, A. Souifi, “Probing electrical properties of
thin oxides and nanostructures at the nanoscale using atomic force microscopy”, TransalpNano, Lyon, October 2008
National Conferences
1. B. Gautier, A. Brugere, W. Hourani, O. Ligor, A. Grandfond, A. Borowiak, D. Albertini, A. Descamps-Mandine, N. Baboux, L. Militaru,
”Mesures électriques par AFM : Les obstacles sur le chemin d'une mesure de qualité métrologique”, Journées de nanométrologie Marseille 17
juin 2013
2. O. Ligor, B. Gautier, A. Descamps, D. Albertini, L. Militaru, N. Baboux, “Nanoscale Characterization Of Ultra-Thin Dielectrics Using Scanning
Capacitance Microscopy”, 2ème Colloque du Laboratoire International Associé Nanotechnologies & Nanosystèmes, Anse, July 2009
3. O. Ligor , Brice Gautier, Armel Descamps-Mandine, David Albertini, Andrei Sabac, Joelle Gregoire, Georges Bremond, Barbara Bazer-Bachi,
“Parasitic capacitance affecting Scanning Capacitance Measurements”, Forum des Microscopies à sonde locale, Neufchâtel-Hardelot, March
2009
4. Georges Brémond, Octavian Ligor, Armel Descamps, David Albertini, Brice Gautier, Toshio Sakurai, Yukio Hasegawa, Kotone Akiyama,
“Utilisation de pointe métallique pour améliorer la spectroscopie en SCM”, Forum des Microscopies à sonde locale, Neufchâtel-Hardelot, March
2009
5. Brice Gautier, O. Ligor, Didier Goghero, Armel Descamps, Jean Claude Dupuy, Georges Bremond, “Cartographie des dopants en deux
dimensions”, Journées de Matière Condensée, Toulouse, September 2006
Communications
1. Georges Brémond, Octavian Ligor, Armel Descamps, David Albertini, Brice Gautier, Toshio Sakurai, Yukio Hasegawa, Kotone Akiyama,
“Scanning electrical mode using atomic force microscopy as un tool for nanodevices characterization in micro and nano engineering”, ELyT-Lab
Workshop Japan, Tohoku, December 2008
2. Octavian Ligor, Armel Descamps-Mandine, David Albertini, Georges Bremond, Brice Gautier, “Amélioration du rapport signal sur bruit de la
Scanning Capacitance Microscopy pour la cartographie des dopants et des oxydes ultra-minces”, Journées Veeco, Rennes, November 2008
3. O. Ligor, B. Gautier, L. Military, A. Descamps, “Scanning Capacitance Microscopy as a tool for dopant mapping and oxide characterization”,
SEMICON, Stuttgart, Germany, July 2008
4. Brice Gautier, Didier Goghero, O. Ligor , Armel Descamps, Georges Bremond, Jean Claude Dupuy, “Comparaison des modes « boucle
ouverte » et « boucle fermée » pour la résolution spatiale de la Scanning Capacitance Microscopy (SCM)”, Journees Veeco, Gif sur Yvette,
November 2006
5. R. Muller, P. Obreja, E Manea, D. Esinenco, G. Conache, O. Ligor , D. Apostol, V. Damian, M. Mateescu, L. Moldovan, M. Diaconu,
“Preliminary experiments for an integrated optical biosensor”; National Seminar of Nanoscience and Nanotechnology, Romanian Academy,
Bucharest, January 2005
Date: 31.01.2014
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Octavian Ligor